Time-dependent Degradation Effects in Top-gate Amorphous Silicon Hydrogenated Thin-film Transistors

N. Golo-Tosic, F.G. Kuper, A.J. Mouthaan, S. van der Wal

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of SAFE conference 2000
    Place of PublicationVeldhoven, The Netherlands
    Number of pages5
    Publication statusPublished - 29 Nov 2000


    • METIS-113894

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