Time-dependent Degradation Effects in Top-gate Amorphous Silicon Hydrogenated Thin-film Transistors

N. Golo-Tosic, F.G. Kuper, A.J. Mouthaan, S. van der Wal

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of SAFE conference 2000
Place of Publication	Veldhoven, The Netherlands
Pages	-
Number of pages	5
Publication status	Published - 29 Nov 2000

Keywords

@inproceedings{362ac775441d44768f62eb3f8e6da17e,

title = "Time-dependent Degradation Effects in Top-gate Amorphous Silicon Hydrogenated Thin-film Transistors",

keywords = "METIS-113894",

author = "N. Golo-Tosic and F.G. Kuper and A.J. Mouthaan and {van der Wal}, S.",

year = "2000",

month = nov,

day = "29",

language = "Undefined",

pages = "--",

booktitle = "Proceedings of SAFE conference 2000",

}