TiO2 channel waveguides with 0.5 dB/cm propagation losses: (Student paper)

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Abstract

Scattering represents a major contribution to the optical propagation losses of channel waveguides. By optimization of the reactive sputtering deposition process, volume scattering can be minimized. In this work, we focus on the reduction of surface scattering by applying a chemical mechanical polishing step following reactive sputter deposition of TiO2 layers. Propagation losses below 0.1 dB/cm at 980 nm of wavelength were experimentally characterized for TiO2 slabs on oxidized silicon wafers. The propagation loss increases to 0.5 dB/cm at 1550 nm of wavelength for fully etched channel waveguides. Such low propagation loss paves the way for the utilization of TiO2 in advanced integrated photonics circuits.
Original languageEnglish
Title of host publicationECIO 2022: 23rd European Conference on Integrated Optics
Subtitle of host publication4th May - 6th May, Milan, Italy
Place of PublicationMilan
PublisherPolitecnico di Milano
Pages375-377
Number of pages4
Publication statusPublished - 2022
Event23rd European Conference on Integrated Optics, ECIO 2022 - Milan, Italy
Duration: 4 May 20226 May 2022
Conference number: 23

Conference

Conference23rd European Conference on Integrated Optics, ECIO 2022
Abbreviated titleECIO
Country/TerritoryItaly
CityMilan
Period4/05/226/05/22

Keywords

  • Titanium dioxide
  • Amorphous
  • Chemical mechanical polishing
  • Optical propagation loss
  • Reactive sputtering

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