Tolerance-Box Generation in Mixed-Signal SoC Testing

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    Original languageUndefined
    Title of host publicationProceedings of the ProRISC Conference
    Place of PublicationVeldhoven, the Netherlands
    Pages342-347
    Number of pages6
    Publication statusPublished - 29 Nov 2001
    Event14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003 - Veldhoven, Netherlands
    Duration: 25 Nov 200327 Nov 2003
    Conference number: 14

    Workshop

    Workshop14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003
    Abbreviated titleProRISC
    CountryNetherlands
    CityVeldhoven
    Period25/11/0327/11/03

    Keywords

    • METIS-201779

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