Tolerance-Box Propagation in Analogue Testing

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of the 7th IEEE International Mixed-Signal Testing Workshop
    Place of PublicationAtlanta, USA
    Pages156-160
    Number of pages5
    Publication statusPublished - 13 Jun 2001
    Event2001 7th IEEE International Mixed-Signal Testing Workshop, IMSTW 2001 - Atlanta, United States
    Duration: 13 Jun 200115 Jun 2001
    Conference number: 7

    Conference

    Conference2001 7th IEEE International Mixed-Signal Testing Workshop, IMSTW 2001
    Abbreviated titleIMSTW
    CountryUnited States
    CityAtlanta
    Period13/06/0115/06/01

    Keywords

    • METIS-201873

    Cite this

    Fang, L., & Kerkhoff, H. G. (2001). Tolerance-Box Propagation in Analogue Testing. In Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop (pp. 156-160). Atlanta, USA.