Tolerance-Box Propagation in Analogue Testing

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of the 7th IEEE International Mixed-Signal Testing Workshop
    Place of PublicationAtlanta, USA
    Pages156-160
    Number of pages5
    Publication statusPublished - 13 Jun 2001
    Event2001 7th IEEE International Mixed-Signal Testing Workshop, IMSTW 2001 - Atlanta, United States
    Duration: 13 Jun 200115 Jun 2001
    Conference number: 7

    Conference

    Conference2001 7th IEEE International Mixed-Signal Testing Workshop, IMSTW 2001
    Abbreviated titleIMSTW
    CountryUnited States
    CityAtlanta
    Period13/06/0115/06/01

    Keywords

    • METIS-201873

    Cite this

    Fang, L., & Kerkhoff, H. G. (2001). Tolerance-Box Propagation in Analogue Testing. In Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop (pp. 156-160). Atlanta, USA.
    Fang, L. ; Kerkhoff, Hans G. / Tolerance-Box Propagation in Analogue Testing. Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop. Atlanta, USA, 2001. pp. 156-160
    @inproceedings{36d21db701a541abb0ac54a8a623f7e8,
    title = "Tolerance-Box Propagation in Analogue Testing",
    keywords = "METIS-201873",
    author = "L. Fang and Kerkhoff, {Hans G.}",
    year = "2001",
    month = "6",
    day = "13",
    language = "Undefined",
    pages = "156--160",
    booktitle = "Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop",

    }

    Fang, L & Kerkhoff, HG 2001, Tolerance-Box Propagation in Analogue Testing. in Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop. Atlanta, USA, pp. 156-160, 2001 7th IEEE International Mixed-Signal Testing Workshop, IMSTW 2001, Atlanta, United States, 13/06/01.

    Tolerance-Box Propagation in Analogue Testing. / Fang, L.; Kerkhoff, Hans G.

    Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop. Atlanta, USA, 2001. p. 156-160.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Tolerance-Box Propagation in Analogue Testing

    AU - Fang, L.

    AU - Kerkhoff, Hans G.

    PY - 2001/6/13

    Y1 - 2001/6/13

    KW - METIS-201873

    M3 - Conference contribution

    SP - 156

    EP - 160

    BT - Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop

    CY - Atlanta, USA

    ER -

    Fang L, Kerkhoff HG. Tolerance-Box Propagation in Analogue Testing. In Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop. Atlanta, USA. 2001. p. 156-160