Tolerance-Box Propagation in Analogue Testing

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop
Place of Publication	Atlanta, USA
Pages	156-160
Number of pages	5
Publication status	Published - 13 Jun 2001
Event	2001 7th IEEE International Mixed-Signal Testing Workshop, IMSTW 2001 - Atlanta, United States Duration: 13 Jun 2001 → 15 Jun 2001 Conference number: 7

Conference	2001 7th IEEE International Mixed-Signal Testing Workshop, IMSTW 2001
Abbreviated title	IMSTW
Country/Territory	United States
City	Atlanta
Period	13/06/01 → 15/06/01

Keywords

@inproceedings{36d21db701a541abb0ac54a8a623f7e8,

title = "Tolerance-Box Propagation in Analogue Testing",

keywords = "METIS-201873",

author = "L. Fang and Kerkhoff, \{Hans G.\}",

year = "2001",

month = jun,

day = "13",

language = "Undefined",

pages = "156--160",

booktitle = "Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop",

note = "2001 7th IEEE International Mixed-Signal Testing Workshop, IMSTW 2001 ; Conference date: 13-06-2001 Through 15-06-2001",

}

TY - GEN

T1 - Tolerance-Box Propagation in Analogue Testing

AU - Fang, L.

AU - Kerkhoff, Hans G.

N1 - Conference code: 7

PY - 2001/6/13

Y1 - 2001/6/13

KW - METIS-201873

M3 - Conference contribution

SP - 156

EP - 160

BT - Proceedings of the 7th IEEE International Mixed-Signal Testing Workshop

CY - Atlanta, USA

T2 - 2001 7th IEEE International Mixed-Signal Testing Workshop, IMSTW 2001

Y2 - 13 June 2001 through 15 June 2001

ER -