Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale

G.M. Kim, B.J. Kim, J. Holleman, Jurriaan Huskens, E.S. ten Have, Alexeij Y. Kovalgin, M. Liebau, David Reinhoudt, N.F. van Hulst, J. Brugger

Research output: Contribution to conferencePaper

Original languageUndefined
Pages71-78
Publication statusPublished - 19 Jun 2002
Event3rd Korea-Swiss Joint Symposium 2002: Proceedings of the 3rd Korea-Swiss Joint Symposium -
Duration: 19 Jun 200220 Jun 2002

Conference

Conference3rd Korea-Swiss Joint Symposium 2002
Period19/06/0220/06/02

Keywords

  • METIS-245297

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