Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale

G.M. Kim; B.J. Kim; J. Holleman; Jurriaan Huskens; E.S. ten Have; Alexeij Y. Kovalgin; M. Liebau; David Reinhoudt; N.F. van Hulst; J. Brugger

Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale

G.M. Kim, B.J. Kim, J. Holleman, Jurriaan Huskens, E.S. ten Have, Alexeij Y. Kovalgin, M. Liebau, David Reinhoudt, N.F. van Hulst, J. Brugger

Optical Sciences

Research output: Contribution to conference › Paper

Original language	Undefined
Pages	71-78
Publication status	Published - 19 Jun 2002

Keywords

METIS-245297

Cite this

Kim, G. M., Kim, B. J., Holleman, J., Huskens, J., ten Have, E. S., Kovalgin, A. Y., ... Brugger, J. (2002). Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale. 71-78.

@conference{ec1a647e89144f31a1a07dccb18cfb31,

title = "Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale",

keywords = "METIS-245297",

author = "G.M. Kim and B.J. Kim and J. Holleman and Jurriaan Huskens and {ten Have}, E.S. and Kovalgin, {Alexeij Y.} and M. Liebau and David Reinhoudt and {van Hulst}, N.F. and J. Brugger",

year = "2002",

month = "6",

day = "19",

language = "Undefined",

pages = "71--78",

}