Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale

G.M. Kim, B.J. Kim, J. Holleman, Jurriaan Huskens, E.S. ten Have, Alexeij Y. Kovalgin, M. Liebau, David Reinhoudt, N.F. van Hulst, J. Brugger

Research output: Contribution to conferencePaper

Original languageUndefined
Pages71-78
Publication statusPublished - 19 Jun 2002

Keywords

  • METIS-245297

Cite this

Kim, G. M., Kim, B. J., Holleman, J., Huskens, J., ten Have, E. S., Kovalgin, A. Y., ... Brugger, J. (2002). Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale. 71-78.