Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale

G.M. Kim, B.J. Kim, J. Holleman, Jurriaan Huskens, E.S. ten Have, Alexeij Y. Kovalgin, M. Liebau, David Reinhoudt, N.F. van Hulst, J. Brugger

Research output: Contribution to conference › Paper › Academic

Original languageUndefined
Pages71-78
Publication statusPublished - 19 Jun 2002

Keywords

  • METIS-245297

Cite this

Kim, G. M., Kim, B. J., Holleman, J., Huskens, J., ten Have, E. S., Kovalgin, A. Y., ... Brugger, J. (2002). Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale. 71-78.
Kim, G.M. ; Kim, B.J. ; Holleman, J. ; Huskens, Jurriaan ; ten Have, E.S. ; Kovalgin, Alexeij Y. ; Liebau, M. ; Reinhoudt, David ; van Hulst, N.F. ; Brugger, J. / Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale.
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title = "Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale",
keywords = "METIS-245297",
author = "G.M. Kim and B.J. Kim and J. Holleman and Jurriaan Huskens and {ten Have}, E.S. and Kovalgin, {Alexeij Y.} and M. Liebau and David Reinhoudt and {van Hulst}, N.F. and J. Brugger",
year = "2002",
month = "6",
day = "19",
language = "Undefined",
pages = "71--78",

}

Kim, GM, Kim, BJ, Holleman, J, Huskens, J, ten Have, ES, Kovalgin, AY, Liebau, M, Reinhoudt, D, van Hulst, NF & Brugger, J 2002, 'Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale' pp. 71-78.

Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale. / Kim, G.M.; Kim, B.J.; Holleman, J.; Huskens, Jurriaan; ten Have, E.S.; Kovalgin, Alexeij Y.; Liebau, M.; Reinhoudt, David; van Hulst, N.F.; Brugger, J.

2002. 71-78.

Research output: Contribution to conference › Paper › Academic

TY - CONF

T1 - Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale

AU - Kim, G.M.

AU - Kim, B.J.

AU - Holleman, J.

AU - Huskens, Jurriaan

AU - ten Have, E.S.

AU - Kovalgin, Alexeij Y.

AU - Liebau, M.

AU - Reinhoudt, David

AU - van Hulst, N.F.

AU - Brugger, J.

PY - 2002/6/19

Y1 - 2002/6/19

KW - METIS-245297

M3 - Paper

SP - 71

EP - 78

ER -

Kim GM, Kim BJ, Holleman J, Huskens J, ten Have ES, Kovalgin AY et al. Top-down meets bottom-up: nano-engineering for link between nm-and mu-scale. 2002.