Topside Engineering based on EM Modeling and Validation

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    Original languageUndefined
    Title of host publicationDoD EEE Review 2005
    Place of PublicationLas Vegas, USA
    PublisherEEE
    Pages-
    Number of pages32
    Publication statusPublished - 2005

    Keywords

    • METIS-225858

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