Toward spectral-domain optical coherence tomography on a chip

B.I. Akça, V.D. Nguyen, J. Kalkman, N. Ismail, G. Sengo, F. Sun, A. Driessen, Ton van Leeuwen, Markus Pollnau, Kerstin Worhoff, R.M. de Ridder

Research output: Contribution to journalArticleAcademicpeer-review

43 Citations (Scopus)

Abstract

We present experimental results of a spectral-domain optical coherence tomography system based on an integrated optical spectrometer. A 195-channel arrayed-waveguide-grating (AWG) spectrometer with 0.4-nm channel spacing centered at 1300 nm and a 125-channel AWG with 0.16-nm channel spacing centered at 800 nm have been fabricated in silicon oxynitride waveguide technology. Interferometric distance measurements have been performed by launching light from a broadband source into a free-space Michelson interferometer, with its output coupled into the AWG. A maximum imaging depth of 1 mm and axial resolution of 25 and 20 μm in air are demonstrated for the 800- and 1300-nm ranges, respectively.
Original languageEnglish
Pages (from-to)1223-1233
Number of pages11
JournalIEEE journal of selected topics in quantum electronics
Volume18
Issue number3
DOIs
Publication statusPublished - May 2012

Keywords

  • Arrayed waveguide grating (AWG)
  • Silicon oxynitride (SiON)
  • Optical coherencetomography (OCT)
  • Optical waveguides
  • IOMS-PIT: PHOTONICS INTEGRATION TECHNOLOGY
  • Spectrometer

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