Abstract
We present experimental results of a spectral-domain optical coherence tomography system based on an integrated optical spectrometer. A 195-channel arrayed-waveguide-grating (AWG) spectrometer with 0.4-nm channel spacing centered at 1300 nm and a 125-channel AWG with 0.16-nm channel spacing centered at 800 nm have been fabricated in silicon oxynitride waveguide technology. Interferometric distance measurements have been performed by launching light from a broadband source into a free-space Michelson interferometer, with its output coupled into the AWG. A maximum imaging depth of 1 mm and axial resolution of 25 and 20 μm in air are demonstrated for the 800- and 1300-nm ranges, respectively.
Original language | English |
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Pages (from-to) | 1223-1233 |
Number of pages | 11 |
Journal | IEEE journal of selected topics in quantum electronics |
Volume | 18 |
Issue number | 3 |
DOIs | |
Publication status | Published - May 2012 |
Keywords
- Arrayed waveguide grating (AWG)
- Silicon oxynitride (SiON)
- Optical coherencetomography (OCT)
- Optical waveguides
- IOMS-PIT: PHOTONICS INTEGRATION TECHNOLOGY
- Spectrometer