Towards an Accurate Scaling Relation for the Critical Current in Niobium-Tin Conductors

    Research output: Contribution to conferencePosterOther research output

    Original languageUndefined
    Pages-
    Publication statusPublished - 24 Sep 2001
    Event17th International Conference on Magnet Technology, MT-17 2001 - Geneva, Switzerland
    Duration: 24 Sep 200128 Sep 2001
    Conference number: 17

    Conference

    Conference17th International Conference on Magnet Technology, MT-17 2001
    Abbreviated titleMT
    CountrySwitzerland
    CityGeneva
    Period24/09/0128/09/01

    Keywords

    • METIS-200659

    Cite this

    Godeke, A., ten Haken, B., & ten Kate, H. H. J. (2001). Towards an Accurate Scaling Relation for the Critical Current in Niobium-Tin Conductors. -. Poster session presented at 17th International Conference on Magnet Technology, MT-17 2001, Geneva, Switzerland.
    Godeke, A. ; ten Haken, Bernard ; ten Kate, Herman H.J. / Towards an Accurate Scaling Relation for the Critical Current in Niobium-Tin Conductors. Poster session presented at 17th International Conference on Magnet Technology, MT-17 2001, Geneva, Switzerland.
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    title = "Towards an Accurate Scaling Relation for the Critical Current in Niobium-Tin Conductors",
    keywords = "METIS-200659",
    author = "A. Godeke and {ten Haken}, Bernard and {ten Kate}, {Herman H.J.}",
    year = "2001",
    month = "9",
    day = "24",
    language = "Undefined",
    pages = "--",
    note = "null ; Conference date: 24-09-2001 Through 28-09-2001",

    }

    Godeke, A, ten Haken, B & ten Kate, HHJ 2001, 'Towards an Accurate Scaling Relation for the Critical Current in Niobium-Tin Conductors' 17th International Conference on Magnet Technology, MT-17 2001, Geneva, Switzerland, 24/09/01 - 28/09/01, pp. -.

    Towards an Accurate Scaling Relation for the Critical Current in Niobium-Tin Conductors. / Godeke, A.; ten Haken, Bernard; ten Kate, Herman H.J.

    2001. - Poster session presented at 17th International Conference on Magnet Technology, MT-17 2001, Geneva, Switzerland.

    Research output: Contribution to conferencePosterOther research output

    TY - CONF

    T1 - Towards an Accurate Scaling Relation for the Critical Current in Niobium-Tin Conductors

    AU - Godeke, A.

    AU - ten Haken, Bernard

    AU - ten Kate, Herman H.J.

    PY - 2001/9/24

    Y1 - 2001/9/24

    KW - METIS-200659

    M3 - Poster

    SP - -

    ER -

    Godeke A, ten Haken B, ten Kate HHJ. Towards an Accurate Scaling Relation for the Critical Current in Niobium-Tin Conductors. 2001. Poster session presented at 17th International Conference on Magnet Technology, MT-17 2001, Geneva, Switzerland.