Towards an automated and reusable in-field self-test solution for MPSoCs

Ahmed Mohammed Youssef Ibrahim, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)

    Abstract

    Logic Built-In-Self-Test has been used for long time in order to reduce the cost of manufacturing tests. Recently, LBIST has been increasingly used for lifetime dependability tests, especially in safety-critical applications such as in automotive. In this paper, the use of the IEEE 1687 standard for enabling an automated in-field LBIST solution with reusable test procedures is introduced. An IEEE 1687-compliant dependability manager which is capable of performing LBIST on IEEE 1500 wrapped cores is proposed. By using the IEEE 1687 networks for test delivery, LBIST-access and configuration, this solution becomes reusable and consequently reduces the design time.
    Original languageUndefined
    Title of host publication28th International Conference on Microelectronics (ICM 2016)
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Pages249-252
    Number of pages4
    ISBN (Print)978-1-5090-5721-4
    DOIs
    Publication statusPublished - 17 Dec 2016
    Event28th International Conference on Microelectronics, ICM 2016 - Giza, Egypt
    Duration: 17 Dec 201620 Dec 2016

    Publication series

    Name
    PublisherIEEE Computer Society

    Conference

    Conference28th International Conference on Microelectronics, ICM 2016
    Period17/12/1620/12/16
    Other17-20 December 2016

    Keywords

    • IR-103473
    • METIS-321722
    • EWI-27743

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