@inproceedings{1b03e2499cc04119b748dc7af5b9c814,
title = "Towards an automated and reusable in-field self-test solution for MPSoCs",
abstract = "Logic Built-In-Self-Test has been used for long time in order to reduce the cost of manufacturing tests. Recently, LBIST has been increasingly used for lifetime dependability tests, especially in safety-critical applications such as in automotive. In this paper, the use of the IEEE 1687 standard for enabling an automated in-field LBIST solution with reusable test procedures is introduced. An IEEE 1687-compliant dependability manager which is capable of performing LBIST on IEEE 1500 wrapped cores is proposed. By using the IEEE 1687 networks for test delivery, LBIST-access and configuration, this solution becomes reusable and consequently reduces the design time.",
keywords = "IR-103473, METIS-321722, EWI-27743",
author = "Ibrahim, {Ahmed Mohammed Youssef} and Kerkhoff, {Hans G.}",
note = "10.1109/ICM.2016.7847862 ; null ; Conference date: 17-12-2016 Through 20-12-2016",
year = "2016",
month = dec,
day = "17",
doi = "10.1109/ICM.2016.7847862",
language = "Undefined",
isbn = "978-1-5090-5721-4",
publisher = "IEEE Computer Society",
pages = "249--252",
booktitle = "28th International Conference on Microelectronics (ICM 2016)",
address = "United States",
}