Towards an automated and reusable in-field self-test solution for MPSoCs

Ahmed Mohammed Youssef Ibrahim; Hans G. Kerkhoff

doi:10.1109/ICM.2016.7847862

Towards an automated and reusable in-field self-test solution for MPSoCs

Ahmed Mohammed Youssef Ibrahim
, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

12 Downloads (Pure)

Abstract

Logic Built-In-Self-Test has been used for long time in order to reduce the cost of manufacturing tests. Recently, LBIST has been increasingly used for lifetime dependability tests, especially in safety-critical applications such as in automotive. In this paper, the use of the IEEE 1687 standard for enabling an automated in-field LBIST solution with reusable test procedures is introduced. An IEEE 1687-compliant dependability manager which is capable of performing LBIST on IEEE 1500 wrapped cores is proposed. By using the IEEE 1687 networks for test delivery, LBIST-access and configuration, this solution becomes reusable and consequently reduces the design time.

Original language	English
Title of host publication	28th International Conference on Microelectronics (ICM 2016)
Place of Publication	USA
Publisher	IEEE
Pages	249-252
Number of pages	4
ISBN (Print)	978-1-5090-5721-4
DOIs	https://doi.org/10.1109/ICM.2016.7847862
Publication status	Published - 9 Feb 2017
Event	28th International Conference on Microelectronics, ICM 2016 - Giza, Egypt Duration: 17 Dec 2016 → 20 Dec 2016 Conference number: 28

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	28th International Conference on Microelectronics, ICM 2016
Abbreviated title	ICM 2016
Country/Territory	Egypt
City	Giza
Period	17/12/16 → 20/12/16

Keywords

n/a OA procedure

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/ICM.2016.7847862

Cite this

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title = "Towards an automated and reusable in-field self-test solution for MPSoCs",

abstract = "Logic Built-In-Self-Test has been used for long time in order to reduce the cost of manufacturing tests. Recently, LBIST has been increasingly used for lifetime dependability tests, especially in safety-critical applications such as in automotive. In this paper, the use of the IEEE 1687 standard for enabling an automated in-field LBIST solution with reusable test procedures is introduced. An IEEE 1687-compliant dependability manager which is capable of performing LBIST on IEEE 1500 wrapped cores is proposed. By using the IEEE 1687 networks for test delivery, LBIST-access and configuration, this solution becomes reusable and consequently reduces the design time.",

keywords = "n/a OA procedure",

author = "Ibrahim, \{Ahmed Mohammed Youssef\} and Kerkhoff, \{Hans G.\}",

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AU - Kerkhoff, Hans G.

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Y1 - 2017/2/9

N2 - Logic Built-In-Self-Test has been used for long time in order to reduce the cost of manufacturing tests. Recently, LBIST has been increasingly used for lifetime dependability tests, especially in safety-critical applications such as in automotive. In this paper, the use of the IEEE 1687 standard for enabling an automated in-field LBIST solution with reusable test procedures is introduced. An IEEE 1687-compliant dependability manager which is capable of performing LBIST on IEEE 1500 wrapped cores is proposed. By using the IEEE 1687 networks for test delivery, LBIST-access and configuration, this solution becomes reusable and consequently reduces the design time.

AB - Logic Built-In-Self-Test has been used for long time in order to reduce the cost of manufacturing tests. Recently, LBIST has been increasingly used for lifetime dependability tests, especially in safety-critical applications such as in automotive. In this paper, the use of the IEEE 1687 standard for enabling an automated in-field LBIST solution with reusable test procedures is introduced. An IEEE 1687-compliant dependability manager which is capable of performing LBIST on IEEE 1500 wrapped cores is proposed. By using the IEEE 1687 networks for test delivery, LBIST-access and configuration, this solution becomes reusable and consequently reduces the design time.

KW - n/a OA procedure

U2 - 10.1109/ICM.2016.7847862

DO - 10.1109/ICM.2016.7847862

M3 - Conference contribution

SN - 978-1-5090-5721-4

SP - 249

EP - 252

BT - 28th International Conference on Microelectronics (ICM 2016)

PB - IEEE

CY - USA

T2 - 28th International Conference on Microelectronics, ICM 2016

Y2 - 17 December 2016 through 20 December 2016

ER -

Towards an automated and reusable in-field self-test solution for MPSoCs

Abstract

Publication series

Conference

Keywords

UN SDGs

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Cite this