Towards broadband optical wafer-level testing system with on-chip micro-parabolic mirror

Yujia Kong, H.L. Offerhaus (Contributor), M. Dijkstra (Contributor), S.M. García Blanco (Contributor)

Research output: Contribution to conferencePaperpeer-review

Original languageEnglish
Publication statusPublished - 2022
Event26th annual Symposium of the IEEE Photonics Benelux Chapter 2022 - Eindhoven University of Technology, Eindhoven, Netherlands
Duration: 24 Nov 202225 Nov 2022
Conference number: 26
https://www.aanmelder.nl/ieee-ps-benelux-2022

Conference

Conference26th annual Symposium of the IEEE Photonics Benelux Chapter 2022
Country/TerritoryNetherlands
CityEindhoven
Period24/11/2225/11/22
Internet address

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