Towards broadband optical wafer-level testing system with on-chip micro-parabolic mirror

Yujia Kong, H.L. Offerhaus (Contributor), M. Dijkstra (Contributor), S.M. García Blanco (Contributor)

Research output: Contribution to conference › Paper › peer-review

Original language	English
Publication status	Published - 2022
Event	26th annual Symposium of the IEEE Photonics Benelux Chapter 2022 - Eindhoven University of Technology, Eindhoven, Netherlands Duration: 24 Nov 2022 → 25 Nov 2022 Conference number: 26 https://www.aanmelder.nl/ieee-ps-benelux-2022

Conference	26th annual Symposium of the IEEE Photonics Benelux Chapter 2022
Country/Territory	Netherlands
City	Eindhoven
Period	24/11/22 → 25/11/22
Internet address	https://www.aanmelder.nl/ieee-ps-benelux-2022

Cite this

@conference{1f2df3ac57974dd9b8af6d1995e21934,

title = "Towards broadband optical wafer-level testing system with on-chip micro-parabolic mirror",

author = "Yujia Kong and H.L. Offerhaus and M. Dijkstra and {Garc{\'i}a Blanco}, S.M.",

year = "2022",

language = "English",

note = "26th annual Symposium of the IEEE Photonics Benelux Chapter 2022 ; Conference date: 24-11-2022 Through 25-11-2022",

url = "https://www.aanmelder.nl/ieee-ps-benelux-2022",

}