Towards Explainable Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks

Sebastian Buschjäger, Jian-Jia Chen, Kuan-Hsun Chen, Mario Günzel, Christian Hakert, Katharina Morik, Rodion Novkin, Lukas Pfahler, Mikail Yayla

Research output: Working paper

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Engineering & Materials Science