Towards Structural Testing of Superconductor Electronics

A.J. Arun, Hans G. Kerkhoff

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    Abstract

    Many of the semiconductor technologies are already facing limitations while new-generation data and telecommunication systems are implemented. Although in its infancy, superconductor electronics (SCE) is capable of handling some of these high-end tasks. We have started a defect-oriented test methodology for SCE, so that reliable systems can be implemented in this technology. In this paper, the details of the study on the Rapid Single-Flux Quantum (RSFQ) process are presented. We present common defects in the SCE processes and corresponding test methodologies to detect them. The (measurement) results prove that we are able to detect possible random defects for statistical purposes in yield analysis. This paper also presents possible test methodologies for RSFQ circuits based on defect oriented testing (DOT).
    Original languageUndefined
    Title of host publicationProceedings of IEEE International Test Conference ITC
    Place of PublicationBaltimore, USA
    PublisherIEEE
    Pages1182-1191
    Number of pages10
    ISBN (Print)0-7803-8107-6
    DOIs
    Publication statusPublished - 1 Oct 2003
    EventInternational Test Conference, ITC 2003 - Baltimore, USA
    Duration: 30 Sep 20032 Oct 2003

    Publication series

    Name
    PublisherIEEE
    Volume1

    Conference

    ConferenceInternational Test Conference, ITC 2003
    Period30/09/032/10/03
    OtherSept. 30 - Oct. 2, 2003

    Keywords

    • IR-46408
    • METIS-214904

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