Towards Structural Testing of Superconductor Electronics

A.J. Arun; Hans G. Kerkhoff

doi:10.1109/TEST.2003.1271107

Towards Structural Testing of Superconductor Electronics

A.J. Arun
, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (Scopus)

172 Downloads (Pure)

Abstract

Many of the semiconductor technologies are already facing limitations while new-generation data and telecommunication systems are implemented. Although in its infancy, superconductor electronics (SCE) is capable of handling some of these high-end tasks. We have started a defect-oriented test methodology for SCE, so that reliable systems can be implemented in this technology. In this paper, the details of the study on the Rapid Single-Flux Quantum (RSFQ) process are presented. We present common defects in the SCE processes and corresponding test methodologies to detect them. The (measurement) results prove that we are able to detect possible random defects for statistical purposes in yield analysis. This paper also presents possible test methodologies for RSFQ circuits based on defect oriented testing (DOT).

Original language	Undefined
Title of host publication	Proceedings of IEEE International Test Conference ITC
Place of Publication	Baltimore, USA
Publisher	IEEE
Pages	1182-1191
Number of pages	10
ISBN (Print)	0-7803-8107-6
DOIs	https://doi.org/10.1109/TEST.2003.1271107
Publication status	Published - 1 Oct 2003
Event	International Test Conference, ITC 2003 - Baltimore, USA Duration: 30 Sept 2003 → 2 Oct 2003

Publication series

Name
Publisher	IEEE
Volume	1

Conference

Conference	International Test Conference, ITC 2003
Period	30/09/03 → 2/10/03
Other	Sept. 30 - Oct. 2, 2003

Keywords

IR-46408
METIS-214904

Access to Document

10.1109/TEST.2003.1271107

01271107

Cite this

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title = "Towards Structural Testing of Superconductor Electronics",

abstract = "Many of the semiconductor technologies are already facing limitations while new-generation data and telecommunication systems are implemented. Although in its infancy, superconductor electronics (SCE) is capable of handling some of these high-end tasks. We have started a defect-oriented test methodology for SCE, so that reliable systems can be implemented in this technology. In this paper, the details of the study on the Rapid Single-Flux Quantum (RSFQ) process are presented. We present common defects in the SCE processes and corresponding test methodologies to detect them. The (measurement) results prove that we are able to detect possible random defects for statistical purposes in yield analysis. This paper also presents possible test methodologies for RSFQ circuits based on defect oriented testing (DOT).",

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author = "A.J. Arun and Kerkhoff, \{Hans G.\}",

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doi = "10.1109/TEST.2003.1271107",

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T1 - Towards Structural Testing of Superconductor Electronics

AU - Arun, A.J.

AU - Kerkhoff, Hans G.

PY - 2003/10/1

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N2 - Many of the semiconductor technologies are already facing limitations while new-generation data and telecommunication systems are implemented. Although in its infancy, superconductor electronics (SCE) is capable of handling some of these high-end tasks. We have started a defect-oriented test methodology for SCE, so that reliable systems can be implemented in this technology. In this paper, the details of the study on the Rapid Single-Flux Quantum (RSFQ) process are presented. We present common defects in the SCE processes and corresponding test methodologies to detect them. The (measurement) results prove that we are able to detect possible random defects for statistical purposes in yield analysis. This paper also presents possible test methodologies for RSFQ circuits based on defect oriented testing (DOT).

AB - Many of the semiconductor technologies are already facing limitations while new-generation data and telecommunication systems are implemented. Although in its infancy, superconductor electronics (SCE) is capable of handling some of these high-end tasks. We have started a defect-oriented test methodology for SCE, so that reliable systems can be implemented in this technology. In this paper, the details of the study on the Rapid Single-Flux Quantum (RSFQ) process are presented. We present common defects in the SCE processes and corresponding test methodologies to detect them. The (measurement) results prove that we are able to detect possible random defects for statistical purposes in yield analysis. This paper also presents possible test methodologies for RSFQ circuits based on defect oriented testing (DOT).

KW - IR-46408

KW - METIS-214904

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DO - 10.1109/TEST.2003.1271107

M3 - Conference contribution

SN - 0-7803-8107-6

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EP - 1191

BT - Proceedings of IEEE International Test Conference ITC

PB - IEEE

CY - Baltimore, USA

T2 - International Test Conference, ITC 2003

Y2 - 30 September 2003 through 2 October 2003

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