Transmission Electron Microscopy of Thin Films

J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)1-12
    Number of pages12
    JournalNederlands tijdschrift voor vacuumtechniek
    Volume12
    Publication statusPublished - 1974

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • EWI-5580

    Cite this

    @article{43015e0154f54438b81d5c7b8790b512,
    title = "Transmission Electron Microscopy of Thin Films",
    keywords = "SMI-TST: From 2006 in EWI-TST, SMI-EXP: EXPERIMENTAL TECHNIQUES, EWI-5580",
    author = "J.C. Lodder",
    note = "Imported from SMI Reference manager",
    year = "1974",
    language = "Undefined",
    volume = "12",
    pages = "1--12",
    journal = "Nederlands tijdschrift voor vacuumtechniek",
    issn = "0047-9233",
    publisher = "Nederlandse Vacuumvereniging",

    }

    Transmission Electron Microscopy of Thin Films. / Lodder, J.C.

    In: Nederlands tijdschrift voor vacuumtechniek, Vol. 12, 1974, p. 1-12.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - Transmission Electron Microscopy of Thin Films

    AU - Lodder, J.C.

    N1 - Imported from SMI Reference manager

    PY - 1974

    Y1 - 1974

    KW - SMI-TST: From 2006 in EWI-TST

    KW - SMI-EXP: EXPERIMENTAL TECHNIQUES

    KW - EWI-5580

    M3 - Article

    VL - 12

    SP - 1

    EP - 12

    JO - Nederlands tijdschrift voor vacuumtechniek

    JF - Nederlands tijdschrift voor vacuumtechniek

    SN - 0047-9233

    ER -