Transmission Electron Microscopy on Interface Engineered Superconducting Thin Films

Sara Bals, Gustaav van Tendeloo, Augustinus J.H.M. Rijnders, Mark Huijben, V. Leca, David H.A. Blank

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Abstract

Transmission electron microscopy is used to evaluate different deposition techniques, which optimize the microstructure and physical properties of superconducting thin films. High-resolution electron microscopy proves that the use of an YBa2Cu2O buffer layer can avoid a variable interface configuration in YBa2Cu3O7 thin films grown on SrTiO3. The growth can also be controlled at an atomic level by using sub-unit cell layer epitaxy, which results in films with high quality and few structural defects. Epitaxial strain in Sr0 85La0 15CuO2 infinite layer thin films influences the critical temperature of these films, as well as the microstructure. Compressive stress is released by a modulated or a twinned microstructure, which eliminates superconductivity. On the other hand, also tensile strain seems to lower the critical temperature of the infinite layer.
Original languageUndefined
Pages (from-to)2834-2837
Number of pages4
JournalIEEE transactions on applied superconductivity
Volume13
Issue number2
DOIs
Publication statusPublished - 2003

Keywords

  • METIS-215290
  • IR-40849

Cite this

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title = "Transmission Electron Microscopy on Interface Engineered Superconducting Thin Films",
abstract = "Transmission electron microscopy is used to evaluate different deposition techniques, which optimize the microstructure and physical properties of superconducting thin films. High-resolution electron microscopy proves that the use of an YBa2Cu2O buffer layer can avoid a variable interface configuration in YBa2Cu3O7 thin films grown on SrTiO3. The growth can also be controlled at an atomic level by using sub-unit cell layer epitaxy, which results in films with high quality and few structural defects. Epitaxial strain in Sr0 85La0 15CuO2 infinite layer thin films influences the critical temperature of these films, as well as the microstructure. Compressive stress is released by a modulated or a twinned microstructure, which eliminates superconductivity. On the other hand, also tensile strain seems to lower the critical temperature of the infinite layer.",
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year = "2003",
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journal = "IEEE transactions on applied superconductivity",
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Transmission Electron Microscopy on Interface Engineered Superconducting Thin Films. / Bals, Sara; van Tendeloo, Gustaav; Rijnders, Augustinus J.H.M.; Huijben, Mark; Leca, V.; Blank, David H.A.

In: IEEE transactions on applied superconductivity, Vol. 13, No. 2, 2003, p. 2834-2837.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Transmission Electron Microscopy on Interface Engineered Superconducting Thin Films

AU - Bals, Sara

AU - van Tendeloo, Gustaav

AU - Rijnders, Augustinus J.H.M.

AU - Huijben, Mark

AU - Leca, V.

AU - Blank, David H.A.

PY - 2003

Y1 - 2003

N2 - Transmission electron microscopy is used to evaluate different deposition techniques, which optimize the microstructure and physical properties of superconducting thin films. High-resolution electron microscopy proves that the use of an YBa2Cu2O buffer layer can avoid a variable interface configuration in YBa2Cu3O7 thin films grown on SrTiO3. The growth can also be controlled at an atomic level by using sub-unit cell layer epitaxy, which results in films with high quality and few structural defects. Epitaxial strain in Sr0 85La0 15CuO2 infinite layer thin films influences the critical temperature of these films, as well as the microstructure. Compressive stress is released by a modulated or a twinned microstructure, which eliminates superconductivity. On the other hand, also tensile strain seems to lower the critical temperature of the infinite layer.

AB - Transmission electron microscopy is used to evaluate different deposition techniques, which optimize the microstructure and physical properties of superconducting thin films. High-resolution electron microscopy proves that the use of an YBa2Cu2O buffer layer can avoid a variable interface configuration in YBa2Cu3O7 thin films grown on SrTiO3. The growth can also be controlled at an atomic level by using sub-unit cell layer epitaxy, which results in films with high quality and few structural defects. Epitaxial strain in Sr0 85La0 15CuO2 infinite layer thin films influences the critical temperature of these films, as well as the microstructure. Compressive stress is released by a modulated or a twinned microstructure, which eliminates superconductivity. On the other hand, also tensile strain seems to lower the critical temperature of the infinite layer.

KW - METIS-215290

KW - IR-40849

U2 - 10.1109/TASC.2003.812023

DO - 10.1109/TASC.2003.812023

M3 - Article

VL - 13

SP - 2834

EP - 2837

JO - IEEE transactions on applied superconductivity

JF - IEEE transactions on applied superconductivity

SN - 1051-8223

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ER -