Transmission Lines in CMOS: An Explorative Study

Eric A.M. Klumperink; R. Kreienkamp; T. Ellermeyer; U. Langmann

Transmission Lines in CMOS: An Explorative Study

Eric A.M. Klumperink, R. Kreienkamp, T. Ellermeyer, U. Langmann

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Abstract

On-chip transmission line modelling and design become increasingly important as frequencies are continuously going up. This paper explores possibilities to implement transmission lines on CMOS ICs via coupled coplanar strips. EM-field simulations with SONNET are used to estimate important transmission line properties like characteristic impedance, propagation velocity and loss in a 0.18 micron CMOS Technology. Both metal losses and substrate losses are modeled. Special attention is paid to the effect of the Silicon substrate, in particular to the so called “slow-wave mode‿ that can occur in the Si-SiO2 system.

Original language	Undefined
Number of pages	6
Publication status	Published - Nov 2001
Event	14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003 - Veldhoven, Netherlands Duration: 25 Nov 2003 → 27 Nov 2003 Conference number: 14

Workshop

Workshop	14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003
Abbreviated title	ProRISC
Country/Territory	Netherlands
City	Veldhoven
Period	25/11/03 → 27/11/03

Keywords

CMOS
IR-67426
RF
EWI-14359
microwave techniques
Waveguide
Radio frequency
Transmission line

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Cite this

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title = "Transmission Lines in CMOS: An Explorative Study",

abstract = "On-chip transmission line modelling and design become increasingly important as frequencies are continuously going up. This paper explores possibilities to implement transmission lines on CMOS ICs via coupled coplanar strips. EM-field simulations with SONNET are used to estimate important transmission line properties like characteristic impedance, propagation velocity and loss in a 0.18 micron CMOS Technology. Both metal losses and substrate losses are modeled. Special attention is paid to the effect of the Silicon substrate, in particular to the so called “slow-wave mode‿ that can occur in the Si-SiO2 system.",

keywords = "CMOS, IR-67426, RF, EWI-14359, microwave techniques, Waveguide, Radio frequency, Transmission line",

author = "Klumperink, {Eric A.M.} and R. Kreienkamp and T. Ellermeyer and U. Langmann",

year = "2001",

month = nov,

language = "Undefined",

note = "14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003 ; Conference date: 25-11-2003 Through 27-11-2003",

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TY - CONF

T1 - Transmission Lines in CMOS: An Explorative Study

AU - Klumperink, Eric A.M.

AU - Kreienkamp, R.

AU - Ellermeyer, T.

AU - Langmann, U.

N1 - Conference code: 14

PY - 2001/11

Y1 - 2001/11

N2 - On-chip transmission line modelling and design become increasingly important as frequencies are continuously going up. This paper explores possibilities to implement transmission lines on CMOS ICs via coupled coplanar strips. EM-field simulations with SONNET are used to estimate important transmission line properties like characteristic impedance, propagation velocity and loss in a 0.18 micron CMOS Technology. Both metal losses and substrate losses are modeled. Special attention is paid to the effect of the Silicon substrate, in particular to the so called “slow-wave mode‿ that can occur in the Si-SiO2 system.

AB - On-chip transmission line modelling and design become increasingly important as frequencies are continuously going up. This paper explores possibilities to implement transmission lines on CMOS ICs via coupled coplanar strips. EM-field simulations with SONNET are used to estimate important transmission line properties like characteristic impedance, propagation velocity and loss in a 0.18 micron CMOS Technology. Both metal losses and substrate losses are modeled. Special attention is paid to the effect of the Silicon substrate, in particular to the so called “slow-wave mode‿ that can occur in the Si-SiO2 system.

KW - CMOS

KW - IR-67426

KW - RF

KW - EWI-14359

KW - microwave techniques

KW - Waveguide

KW - Radio frequency

KW - Transmission line

M3 - Paper

T2 - 14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003

Y2 - 25 November 2003 through 27 November 2003

ER -