Transport processes and reduction of IcRn product in YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox ramp-type Josephson junctions

Y.M. Boguslavskij, J. Gao, A.J.H.M. Rijnders, D. Terpstra, G.J. Gerritsma, H. Rogalla

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Abstract

The mechanisms of current passage and the causes of IcRn (critical-current normal-resistance) product reduction of YBCO/PBCO/YBCO ramp-type junctions are analyzed. At PBCO (PrBa2Cu3Ox ) barrier thicknesses L=8-20 nm the junction characteristics are determined by the thickness of the PBCO barrier and its nature. The boundary resistance and depression of the YBCO (YBa2Cu3Ox) superconducting parameters near the interface do not strongly affect the junction parameters. The behaviour of the YBCO/PBCO/YBCO junctions cannot be described by simple SNS (superconductor-normal metal-superconductor) weak-link or SIS (superconductor-insulator-superconductor) tunnel models. A strong pair-breaking effect and a one-center inelastic tunneling process are taken into account to explain the Josephson and normal state characteristics of these junctions
Original languageEnglish
Pages (from-to)2034-2037
Number of pages4
JournalIEEE transactions on applied superconductivity
Volume3
Issue number1
DOIs
Publication statusPublished - 1993
Event1992 Applied Superconductivity Conference, ASC 1992 - Chicago, United States
Duration: 23 Aug 199228 Aug 1992

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