Trends in Process Related Reliability in Integrated Circuits

F.G. Kuper

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the SAFE'98
    Place of PublicationMierlo
    Pages331-337
    Number of pages7
    Publication statusPublished - 26 Nov 1998

    Keywords

    • METIS-113838

    Cite this

    Kuper, F. G. (1998). Trends in Process Related Reliability in Integrated Circuits. In Proceedings of the SAFE'98 (pp. 331-337). Mierlo.
    Kuper, F.G. / Trends in Process Related Reliability in Integrated Circuits. Proceedings of the SAFE'98. Mierlo, 1998. pp. 331-337
    @inproceedings{e2c7e51a53524dd8961ef6aa2122d8e8,
    title = "Trends in Process Related Reliability in Integrated Circuits",
    keywords = "METIS-113838",
    author = "F.G. Kuper",
    year = "1998",
    month = "11",
    day = "26",
    language = "Undefined",
    isbn = "90-73461-15-4",
    pages = "331--337",
    booktitle = "Proceedings of the SAFE'98",

    }

    Kuper, FG 1998, Trends in Process Related Reliability in Integrated Circuits. in Proceedings of the SAFE'98. Mierlo, pp. 331-337.

    Trends in Process Related Reliability in Integrated Circuits. / Kuper, F.G.

    Proceedings of the SAFE'98. Mierlo, 1998. p. 331-337.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Trends in Process Related Reliability in Integrated Circuits

    AU - Kuper, F.G.

    PY - 1998/11/26

    Y1 - 1998/11/26

    KW - METIS-113838

    M3 - Conference contribution

    SN - 90-73461-15-4

    SP - 331

    EP - 337

    BT - Proceedings of the SAFE'98

    CY - Mierlo

    ER -

    Kuper FG. Trends in Process Related Reliability in Integrated Circuits. In Proceedings of the SAFE'98. Mierlo. 1998. p. 331-337