TriPleX waveguide platform: low-loss technology over a wide wavelength range

Arne Leinse, Rene Heideman, M. Hoekman, F. Schreuder, F. Falke, C.G.H. Roeloffzen, L. Zhuang, M. Burla, D.A.I. Marpaung, D.H. Geuzebroek, R. Dekker, E.J. Klein, P.W.L. van Dijk, Ruud Oldenbeuving, R.M. Oldenbeuving

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    33 Citations (Scopus)

    Abstract

    In this article a selection of highlights of the TriPleX™ technology of LioniX is given. The basic waveguide technology is explained with recent benchmark measurements done by University California Santa Barbara (UCSB) and University Twente (UT-TE). In order to show the low loss transparency over a wide wavelength range three examples of applications in different wavelength regimes are described in more detail. These are the Integrated Laser Beam Combiner (ILBC) of XiO Photonics in the visible light, a ringresonator sensing platform of LioniX around 850 nm and a phased array antenna with an Optical Beam Forming Network in the 1550 nm band. Furthermore it is shown that the technology is easily accessible via Multi Project Wafer Runs for which the infrastructure and design libraries are also set up.
    Original languageUndefined
    Title of host publicationProceedings of Integrated Photonics: Materials, Devices, and Applications II
    Place of PublicationUSA
    PublisherSPIE
    Pages1-13
    Number of pages13
    DOIs
    Publication statusPublished - 22 May 2013

    Publication series

    NameProceedings of SPIE Optics & Optoelectronics
    PublisherSPIE
    Volume8767
    ISSN (Print)0277-786X

    Keywords

    • EWI-23433
    • IR-86258
    • METIS-297697

    Cite this

    Leinse, A., Heideman, R., Hoekman, M., Schreuder, F., Falke, F., Roeloffzen, C. G. H., ... Oldenbeuving, R. M. (2013). TriPleX waveguide platform: low-loss technology over a wide wavelength range. In Proceedings of Integrated Photonics: Materials, Devices, and Applications II (pp. 1-13). (Proceedings of SPIE Optics & Optoelectronics; Vol. 8767). USA: SPIE. https://doi.org/10.1117/12.2020574