TTCN-3 for Distributed Testing Embedded Software

Stefan Blom, Thomas Deiß, Natalia Ioustinova, Ari Kontio, Jan Cornelis van de Pol, Axel Rennoch, Natalia Sidorova

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Abstract

TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software in a target environment, the software is usually tested in the host environment. Executing in the host environment often affects the real-time behavior of the software and, consequently, the results of real-time testing. Here we provide a semantics for host-based testing with simulated time and a a simulated-time solution for distributed testing with TTCN-3.
Original languageUndefined
Title of host publicationPerspectives of Systems Informatics
EditorsI. Virbitskaite, A. Voronkov
Place of PublicationBerlin
PublisherSpringer
Pages98-111
Number of pages14
ISBN (Print)978-3-540-70880-3
DOIs
Publication statusPublished - Aug 2007

Publication series

NameLecture Notes in Computer Science
PublisherSpringer Verlag
NumberLNCS4549
Volume4378
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Keywords

  • FMT-TESTING
  • EWI-11292
  • METIS-242024
  • IR-61982
  • CR-B.5.3

Cite this

Blom, S., Deiß, T., Ioustinova, N., Kontio, A., van de Pol, J. C., Rennoch, A., & Sidorova, N. (2007). TTCN-3 for Distributed Testing Embedded Software. In I. Virbitskaite, & A. Voronkov (Eds.), Perspectives of Systems Informatics (pp. 98-111). (Lecture Notes in Computer Science; Vol. 4378, No. LNCS4549). Berlin: Springer. https://doi.org/10.1007/978-3-540-70881-0_11
Blom, Stefan ; Deiß, Thomas ; Ioustinova, Natalia ; Kontio, Ari ; van de Pol, Jan Cornelis ; Rennoch, Axel ; Sidorova, Natalia. / TTCN-3 for Distributed Testing Embedded Software. Perspectives of Systems Informatics. editor / I. Virbitskaite ; A. Voronkov. Berlin : Springer, 2007. pp. 98-111 (Lecture Notes in Computer Science; LNCS4549).
@inproceedings{d1e697182d514b67baa4a4d60a5a0164,
title = "TTCN-3 for Distributed Testing Embedded Software",
abstract = "TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software in a target environment, the software is usually tested in the host environment. Executing in the host environment often affects the real-time behavior of the software and, consequently, the results of real-time testing. Here we provide a semantics for host-based testing with simulated time and a a simulated-time solution for distributed testing with TTCN-3.",
keywords = "FMT-TESTING, EWI-11292, METIS-242024, IR-61982, CR-B.5.3",
author = "Stefan Blom and Thomas Dei{\ss} and Natalia Ioustinova and Ari Kontio and {van de Pol}, {Jan Cornelis} and Axel Rennoch and Natalia Sidorova",
note = "10.1007/978-3-540-70881-0_11",
year = "2007",
month = "8",
doi = "10.1007/978-3-540-70881-0_11",
language = "Undefined",
isbn = "978-3-540-70880-3",
series = "Lecture Notes in Computer Science",
publisher = "Springer",
number = "LNCS4549",
pages = "98--111",
editor = "I. Virbitskaite and A. Voronkov",
booktitle = "Perspectives of Systems Informatics",

}

Blom, S, Deiß, T, Ioustinova, N, Kontio, A, van de Pol, JC, Rennoch, A & Sidorova, N 2007, TTCN-3 for Distributed Testing Embedded Software. in I Virbitskaite & A Voronkov (eds), Perspectives of Systems Informatics. Lecture Notes in Computer Science, no. LNCS4549, vol. 4378, Springer, Berlin, pp. 98-111. https://doi.org/10.1007/978-3-540-70881-0_11

TTCN-3 for Distributed Testing Embedded Software. / Blom, Stefan; Deiß, Thomas; Ioustinova, Natalia; Kontio, Ari; van de Pol, Jan Cornelis; Rennoch, Axel; Sidorova, Natalia.

Perspectives of Systems Informatics. ed. / I. Virbitskaite; A. Voronkov. Berlin : Springer, 2007. p. 98-111 (Lecture Notes in Computer Science; Vol. 4378, No. LNCS4549).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - TTCN-3 for Distributed Testing Embedded Software

AU - Blom, Stefan

AU - Deiß, Thomas

AU - Ioustinova, Natalia

AU - Kontio, Ari

AU - van de Pol, Jan Cornelis

AU - Rennoch, Axel

AU - Sidorova, Natalia

N1 - 10.1007/978-3-540-70881-0_11

PY - 2007/8

Y1 - 2007/8

N2 - TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software in a target environment, the software is usually tested in the host environment. Executing in the host environment often affects the real-time behavior of the software and, consequently, the results of real-time testing. Here we provide a semantics for host-based testing with simulated time and a a simulated-time solution for distributed testing with TTCN-3.

AB - TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software in a target environment, the software is usually tested in the host environment. Executing in the host environment often affects the real-time behavior of the software and, consequently, the results of real-time testing. Here we provide a semantics for host-based testing with simulated time and a a simulated-time solution for distributed testing with TTCN-3.

KW - FMT-TESTING

KW - EWI-11292

KW - METIS-242024

KW - IR-61982

KW - CR-B.5.3

U2 - 10.1007/978-3-540-70881-0_11

DO - 10.1007/978-3-540-70881-0_11

M3 - Conference contribution

SN - 978-3-540-70880-3

T3 - Lecture Notes in Computer Science

SP - 98

EP - 111

BT - Perspectives of Systems Informatics

A2 - Virbitskaite, I.

A2 - Voronkov, A.

PB - Springer

CY - Berlin

ER -

Blom S, Deiß T, Ioustinova N, Kontio A, van de Pol JC, Rennoch A et al. TTCN-3 for Distributed Testing Embedded Software. In Virbitskaite I, Voronkov A, editors, Perspectives of Systems Informatics. Berlin: Springer. 2007. p. 98-111. (Lecture Notes in Computer Science; LNCS4549). https://doi.org/10.1007/978-3-540-70881-0_11