TTF-Based Test-Selection of Mixed-Signal Cores in a SoC

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE International Mixed-Signal Test Workshop (IMSTW)
    Place of PublicationPortland, Oregon USA
    PublisherIEEE
    Pages136-141
    Number of pages6
    Publication statusPublished - 22 Jun 2004
    EventIEEE International Mixed-Signal Test Workshop (IMSTW): Proceedings of the IEEE International Mixed-Signal Test Workshop (IMSTW) - Portland, Oregon USA
    Duration: 22 Jun 200426 Jun 2004

    Conference

    ConferenceIEEE International Mixed-Signal Test Workshop (IMSTW)
    CityPortland, Oregon USA
    Period22/06/0426/06/04

    Keywords

    • METIS-218948

    Cite this