TTF-Based Test-Selection of Mixed-Signal Cores in a SoC

Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the IEEE International Mixed-Signal Test Workshop (IMSTW)
Place of Publication	Portland, Oregon USA
Publisher	IEEE
Pages	136-141
Number of pages	6
Publication status	Published - 22 Jun 2004
Event	IEEE International Mixed-Signal Test Workshop (IMSTW): Proceedings of the IEEE International Mixed-Signal Test Workshop (IMSTW) - Portland, Oregon USA Duration: 22 Jun 2004 → 26 Jun 2004

Conference	IEEE International Mixed-Signal Test Workshop (IMSTW)
City	Portland, Oregon USA
Period	22/06/04 → 26/06/04

Keywords

@inproceedings{fc4bf37bffe24791a7fe314abf84216f,

title = "TTF-Based Test-Selection of Mixed-Signal Cores in a SoC",

keywords = "METIS-218948",

author = "Kerkhoff, {Hans G.}",

year = "2004",

month = jun,

day = "22",

language = "Undefined",

pages = "136--141",

booktitle = "Proceedings of the IEEE International Mixed-Signal Test Workshop (IMSTW)",

publisher = "IEEE",

address = "United States",

note = "IEEE International Mixed-Signal Test Workshop (IMSTW) ; Conference date: 22-06-2004 Through 26-06-2004",

}

TY - GEN

T1 - TTF-Based Test-Selection of Mixed-Signal Cores in a SoC

AU - Kerkhoff, Hans G.

PY - 2004/6/22

Y1 - 2004/6/22

KW - METIS-218948

M3 - Conference contribution

SP - 136

EP - 141

BT - Proceedings of the IEEE International Mixed-Signal Test Workshop (IMSTW)

PB - IEEE

CY - Portland, Oregon USA

T2 - IEEE International Mixed-Signal Test Workshop (IMSTW)

Y2 - 22 June 2004 through 26 June 2004

ER -