Abstract
The microstructure of YBa2Cu3Ox sYBCOd-coated conductors depends strongly on the deposition method and thickness of the YBCO layer. This letter shows how the clear qualitative difference in grain connectivity between vacuum-deposited and solution-grown layers has direct consequences for the spatial distribution of the critical current density sJcd. Pulsed-laser-deposited YBCO conductors usually have a columnar grain structure that results in a two-dimensional current network, as demonstrated with magneto-optical imaging. Consequently, their transport Jc varies considerably on length scales from 50 mm up to 5 mm, with current suppression occurring even at defects that run parallel to the macroscopic current. In contrast, the thicker YBCO coatings in metalorganic-deposited samples have a layered structure, leading to a three-dimensional current path. Magneto-optically, this is deduced from sample-wide shielding currents, while transport experiments reveal much smaller spatial variations in Jc. These results are encouraging for the further development of nonvacuum produced YBCO-coated conductors, since such three-dimensional systems are inherently more “forgiving” of local defects.
Original language | Undefined |
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Article number | 325121 |
Pages (from-to) | - |
Journal | Applied physics letters |
Volume | 86 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2005 |
Keywords
- METIS-225773
- IR-98061