Two calculation procedures for the determination of composition and mass thickness of thin samples by x-ray spectrometry

J.H.H.G. van Willigen, H.T. Weber, M. Bos, W.E. van der Linden

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Abstract

Two procedures are described for calculating the composition and mass thickness of thin samples from measured x-ray intensities. One procedure is suitable for use with a programmable hand calculator but gives correct results only for very thin samples. The other procedure utilizes the NRLXRF program and produces correct results for thin and thick films.
Original languageUndefined
Pages (from-to)379-384
JournalAnalytica chimica acta
Volume136
DOIs
Publication statusPublished - 1982

Keywords

  • IR-68987

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