Two improved methods for testing ADC parametric faults by digital input signals

Xiaoqin Sheng, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)
    70 Downloads (Pure)

    Abstract

    In this paper, two improved methods are presented extending our previous work. The first one improves the results by adjusting the voltage levels of the input pulse wave stimulus. Compared with the sine wave input stimulus, the four-level pulse wave can detect even more faulty cases with the offset faults. The second one improves the results by calculating the similarity of the output spectra between the golden devices and the DUTs. Compared with the previous method [10], it is less sensitive to the jitter and the change of the rise/fall time of the input pulse wave stimulus. In these two methods, a number of golden devices are tested at first to obtain the fault-free range. At last, a signature result is obtained from both methods. It can filter out the faulty devices in a quick way before testing the specific values of the conventional dynamic and static parameters.
    Original languageUndefined
    Title of host publicationIEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop, IMSTW 2009
    Place of PublicationScottsdale, AZ, USA
    PublisherIEEE Computer Society
    Pages1-5
    Number of pages5
    ISBN (Print)978-1-4244-4618-6
    DOIs
    Publication statusPublished - 10 Jun 2009
    Event15th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop, IMS3TW 2009 - Scottsdale, United States
    Duration: 10 Jun 200912 Jun 2009
    Conference number: 15

    Publication series

    Name
    PublisherIEEE Computer Society

    Conference

    Conference15th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop, IMS3TW 2009
    Abbreviated titleIMS3TW
    CountryUnited States
    CityScottsdale
    Period10/06/0912/06/09

    Keywords

    • METIS-264521
    • EWI-17370
    • IR-69801

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