Ultrathin Limit of Exchange Bias Coupling at Oxide Multiferroic/Ferromagnetic Interfaces

Mark Huijben, P. Yu, L.W. Martin, Hajo Molegraaf, Y.H. Chu, M.B. Holcomb, N. Balke, Augustinus J.H.M. Rijnders, R. Ramesh

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Exchange bias coupling at the multiferroic- ferromagnetic interface in BiFeO3/La0.7Sr0.3MnO3 heterostructures exhibits a critical thickness for ultrathin BiFeO3 layers of 5 unit cells (2 nm). Linear dichroism measurements demonstrate the dependence on the BiFeO3 layer thickness with a strong reduction for ultrathin layers, indicating diminished antiferromagnetic ordering that prevents interfacial exchange bias coupling.
Original languageUndefined
Pages (from-to)4739-4745
Number of pages7
JournalAdvanced materials
Issue number34
Publication statusPublished - 2013


  • IR-89952
  • METIS-297083

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