Uncovering dynamic fault trees

Sebastian Junges, Dennis Guck, Joost P. Katoen, Mariëlle Ida Antoinette Stoelinga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 8 Citations

Abstract

Fault tree analysis is a widespread industry standard for assessing system reliability. Standard (static) fault trees model the failure behaviour of systems in dependence of their component failures. To overcome their limited expressive power, common dependability patterns, such as spare management, functional dependencies, and sequencing are considered. A plethora of such dynamic fault trees (DFTs) have been defined in the literature. They differ in e.g., the types of gates (elements), their meaning, expressive power, the way in which failures propagate, how elements are claimed and activated, and how spare races are resolved. This paper systematically uncovers these differences and categorises existing DFT variants. As these differences may have huge impact on the reliability assessment, awareness of these impacts is important when using DFT modelling and analysis.
LanguageEnglish
Title of host publication46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) 2016
Place of PublicationToulouse, France
PublisherInstitute of Electrical and Electronics Engineers
Pages299-310
Number of pages12
ISBN (Electronic)2158-3927
DOIs
StatePublished - Jun 2016
Event46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2016 - ENAC, Toulouse, France
Duration: 28 Jun 20161 Jul 2016
Conference number: 46
https://dsn-2016.sciencesconf.org/

Conference

Conference46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2016
Abbreviated titleDSN 2016
CountryFrance
CityToulouse
Period28/06/161/07/16
Internet address

Fingerprint

Fault tree analysis
Industry

Keywords

  • IR-104513
  • EWI-27798

Cite this

Junges, S., Guck, D., Katoen, J. P., & Stoelinga, M. I. A. (2016). Uncovering dynamic fault trees. In 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) 2016 (pp. 299-310). Toulouse, France: Institute of Electrical and Electronics Engineers. DOI: 10.1109/DSN.2016.35
Junges, Sebastian ; Guck, Dennis ; Katoen, Joost P. ; Stoelinga, Mariëlle Ida Antoinette. / Uncovering dynamic fault trees. 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) 2016. Toulouse, France : Institute of Electrical and Electronics Engineers, 2016. pp. 299-310
@inproceedings{9bf6b1a8f401478cb5f24c5a5fa41085,
title = "Uncovering dynamic fault trees",
abstract = "Fault tree analysis is a widespread industry standard for assessing system reliability. Standard (static) fault trees model the failure behaviour of systems in dependence of their component failures. To overcome their limited expressive power, common dependability patterns, such as spare management, functional dependencies, and sequencing are considered. A plethora of such dynamic fault trees (DFTs) have been defined in the literature. They differ in e.g., the types of gates (elements), their meaning, expressive power, the way in which failures propagate, how elements are claimed and activated, and how spare races are resolved. This paper systematically uncovers these differences and categorises existing DFT variants. As these differences may have huge impact on the reliability assessment, awareness of these impacts is important when using DFT modelling and analysis.",
keywords = "IR-104513, EWI-27798",
author = "Sebastian Junges and Dennis Guck and Katoen, {Joost P.} and Stoelinga, {Mari{\"e}lle Ida Antoinette}",
year = "2016",
month = "6",
doi = "10.1109/DSN.2016.35",
language = "English",
pages = "299--310",
booktitle = "46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) 2016",
publisher = "Institute of Electrical and Electronics Engineers",
address = "United States",

}

Junges, S, Guck, D, Katoen, JP & Stoelinga, MIA 2016, Uncovering dynamic fault trees. in 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) 2016. Institute of Electrical and Electronics Engineers, Toulouse, France, pp. 299-310, 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2016, Toulouse, France, 28/06/16. DOI: 10.1109/DSN.2016.35

Uncovering dynamic fault trees. / Junges, Sebastian; Guck, Dennis; Katoen, Joost P.; Stoelinga, Mariëlle Ida Antoinette.

46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) 2016. Toulouse, France : Institute of Electrical and Electronics Engineers, 2016. p. 299-310.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Uncovering dynamic fault trees

AU - Junges,Sebastian

AU - Guck,Dennis

AU - Katoen,Joost P.

AU - Stoelinga,Mariëlle Ida Antoinette

PY - 2016/6

Y1 - 2016/6

N2 - Fault tree analysis is a widespread industry standard for assessing system reliability. Standard (static) fault trees model the failure behaviour of systems in dependence of their component failures. To overcome their limited expressive power, common dependability patterns, such as spare management, functional dependencies, and sequencing are considered. A plethora of such dynamic fault trees (DFTs) have been defined in the literature. They differ in e.g., the types of gates (elements), their meaning, expressive power, the way in which failures propagate, how elements are claimed and activated, and how spare races are resolved. This paper systematically uncovers these differences and categorises existing DFT variants. As these differences may have huge impact on the reliability assessment, awareness of these impacts is important when using DFT modelling and analysis.

AB - Fault tree analysis is a widespread industry standard for assessing system reliability. Standard (static) fault trees model the failure behaviour of systems in dependence of their component failures. To overcome their limited expressive power, common dependability patterns, such as spare management, functional dependencies, and sequencing are considered. A plethora of such dynamic fault trees (DFTs) have been defined in the literature. They differ in e.g., the types of gates (elements), their meaning, expressive power, the way in which failures propagate, how elements are claimed and activated, and how spare races are resolved. This paper systematically uncovers these differences and categorises existing DFT variants. As these differences may have huge impact on the reliability assessment, awareness of these impacts is important when using DFT modelling and analysis.

KW - IR-104513

KW - EWI-27798

U2 - 10.1109/DSN.2016.35

DO - 10.1109/DSN.2016.35

M3 - Conference contribution

SP - 299

EP - 310

BT - 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) 2016

PB - Institute of Electrical and Electronics Engineers

CY - Toulouse, France

ER -

Junges S, Guck D, Katoen JP, Stoelinga MIA. Uncovering dynamic fault trees. In 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) 2016. Toulouse, France: Institute of Electrical and Electronics Engineers. 2016. p. 299-310. Available from, DOI: 10.1109/DSN.2016.35