Understanding phase contrast in tapping mode atomic force microscopy

M.H.W. Stopel, Kees van der Werf, Henricus T.M. van den Ende, B.J. Vermolen, M.E. van Raaij, Vinod Subramaniam

Research output: Contribution to conferencePoster

Original languageUndefined
Pages-
Publication statusPublished - 29 Sep 2008
EventAnnual Dutch Meeting on Molecular and Cellular Biophysics 2008 - Veldhoven, Netherlands
Duration: 29 Sep 200830 Sep 2008

Conference

ConferenceAnnual Dutch Meeting on Molecular and Cellular Biophysics 2008
CountryNetherlands
CityVeldhoven
Period29/09/0830/09/08

Keywords

  • METIS-253539

Cite this

Stopel, M. H. W., van der Werf, K., van den Ende, H. T. M., Vermolen, B. J., van Raaij, M. E., & Subramaniam, V. (2008). Understanding phase contrast in tapping mode atomic force microscopy. -. Poster session presented at Annual Dutch Meeting on Molecular and Cellular Biophysics 2008, Veldhoven, Netherlands.