Uniaxial Strain Induced Critical Current Degradation of Ag-Sheathed Bi-2212 Round Wire

Chao Dai, Jinggang Qin* (Corresponding Author), Bo Liu, Peihang Liu, Yu Wu, Arend Nijhuis, Chao Zhou, Chenshan Li, Qingbin Hao, Sheng Liu

*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

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