Unit-based functional IDDT testing for aging degradation monitoring in a VLIW processor

Yong Zhao; Hans G. Kerkhoff

doi:10.1109/DSD.2015.113

Unit-based functional IDDT testing for aging degradation monitoring in a VLIW processor

Yong Zhao, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

7 Citations (Scopus)

1 Downloads (Pure)

Abstract

In this paper, functional unit-based IDDT testing has been applied for a 90nm VLIW processor to monitor its aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test-program development based on the architecture of a single DSP processor, as well as implementation of an accelerated test (AT) is investigated and IDDT measurement results are evaluated. It is found that decrements of peak IDDT values of crucial functional units inside the processor characterize the power-law degradation with the aging time. This is in coherence with the aging behaviour of (PMOS) transistors caused by Negative-Bias-Temperature-Instability (NBTI), thereby validating the feasibility of this technique in monitoring target-process aging degradation.

Original language	Undefined
Title of host publication	18th Euromicro Conference on Digital Systems Design, DSD 2015
Place of Publication	USA
Publisher	IEEE Computer Society
Pages	353-358
Number of pages	6
ISBN (Print)	978-1-4673-8035-5
DOIs	https://doi.org/10.1109/DSD.2015.113
Publication status	Published - Oct 2015
Event	18th EUROMICRO Conference on Digital System Design, DSD 2015 - Funchal, Portugal Duration: 26 Aug 2015 → 28 Aug 2015 Conference number: 18

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	18th EUROMICRO Conference on Digital System Design, DSD 2015
Abbreviated title	DSD
Country/Territory	Portugal
City	Funchal
Period	26/08/15 → 28/08/15

Keywords

EWI-26388
reliability testing
NBTI
accelerated test
IR-98247
Aging
DSP processor
IDDT testing
METIS-314988
functional testing

Access to Document

10.1109/DSD.2015.113

http://eprints.eemcs.utwente.nl/secure2/26388/01/DSD_2015_yong_1_july_camera.pdf

Cite this

@inproceedings{5bcdcb9337684c0d9e66c43afebbf361,

title = "Unit-based functional IDDT testing for aging degradation monitoring in a VLIW processor",

abstract = "In this paper, functional unit-based IDDT testing has been applied for a 90nm VLIW processor to monitor its aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test-program development based on the architecture of a single DSP processor, as well as implementation of an accelerated test (AT) is investigated and IDDT measurement results are evaluated. It is found that decrements of peak IDDT values of crucial functional units inside the processor characterize the power-law degradation with the aging time. This is in coherence with the aging behaviour of (PMOS) transistors caused by Negative-Bias-Temperature-Instability (NBTI), thereby validating the feasibility of this technique in monitoring target-process aging degradation.",

keywords = "EWI-26388, reliability testing, NBTI, accelerated test, IR-98247, Aging, DSP processor, IDDT testing, METIS-314988, functional testing",

author = "Yong Zhao and Kerkhoff, {Hans G.}",

note = "10.1109/DSD.2015.113 ; null ; Conference date: 26-08-2015 Through 28-08-2015",

year = "2015",

month = oct,

doi = "10.1109/DSD.2015.113",

language = "Undefined",

isbn = "978-1-4673-8035-5",

publisher = "IEEE Computer Society",

pages = "353--358",

booktitle = "18th Euromicro Conference on Digital Systems Design, DSD 2015",

address = "United States",

}

TY - GEN

T1 - Unit-based functional IDDT testing for aging degradation monitoring in a VLIW processor

AU - Zhao, Yong

AU - Kerkhoff, Hans G.

N1 - Conference code: 18

PY - 2015/10

Y1 - 2015/10

N2 - In this paper, functional unit-based IDDT testing has been applied for a 90nm VLIW processor to monitor its aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test-program development based on the architecture of a single DSP processor, as well as implementation of an accelerated test (AT) is investigated and IDDT measurement results are evaluated. It is found that decrements of peak IDDT values of crucial functional units inside the processor characterize the power-law degradation with the aging time. This is in coherence with the aging behaviour of (PMOS) transistors caused by Negative-Bias-Temperature-Instability (NBTI), thereby validating the feasibility of this technique in monitoring target-process aging degradation.

AB - In this paper, functional unit-based IDDT testing has been applied for a 90nm VLIW processor to monitor its aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test-program development based on the architecture of a single DSP processor, as well as implementation of an accelerated test (AT) is investigated and IDDT measurement results are evaluated. It is found that decrements of peak IDDT values of crucial functional units inside the processor characterize the power-law degradation with the aging time. This is in coherence with the aging behaviour of (PMOS) transistors caused by Negative-Bias-Temperature-Instability (NBTI), thereby validating the feasibility of this technique in monitoring target-process aging degradation.

KW - EWI-26388

KW - reliability testing

KW - NBTI

KW - accelerated test

KW - IR-98247

KW - Aging

KW - DSP processor

KW - IDDT testing

KW - METIS-314988

KW - functional testing

U2 - 10.1109/DSD.2015.113

DO - 10.1109/DSD.2015.113

M3 - Conference contribution

SN - 978-1-4673-8035-5

SP - 353

EP - 358

BT - 18th Euromicro Conference on Digital Systems Design, DSD 2015

PB - IEEE Computer Society

CY - USA

Y2 - 26 August 2015 through 28 August 2015

ER -