Unit-based functional IDDT testing for aging degradation monitoring in a VLIW processor

Yong Zhao, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    7 Citations (Scopus)
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    In this paper, functional unit-based IDDT testing has been applied for a 90nm VLIW processor to monitor its aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test-program development based on the architecture of a single DSP processor, as well as implementation of an accelerated test (AT) is investigated and IDDT measurement results are evaluated. It is found that decrements of peak IDDT values of crucial functional units inside the processor characterize the power-law degradation with the aging time. This is in coherence with the aging behaviour of (PMOS) transistors caused by Negative-Bias-Temperature-Instability (NBTI), thereby validating the feasibility of this technique in monitoring target-process aging degradation.
    Original languageUndefined
    Title of host publication18th Euromicro Conference on Digital Systems Design, DSD 2015
    Place of PublicationUSA
    Number of pages6
    ISBN (Print)978-1-4673-8035-5
    Publication statusPublished - Oct 2015
    Event18th EUROMICRO Conference on Digital System Design, DSD 2015 - Funchal, Portugal
    Duration: 26 Aug 201528 Aug 2015
    Conference number: 18

    Publication series

    PublisherIEEE Computer Society


    Conference18th EUROMICRO Conference on Digital System Design, DSD 2015
    Abbreviated titleDSD


    • EWI-26388
    • reliability testing
    • NBTI
    • accelerated test
    • IR-98247
    • Aging
    • DSP processor
    • IDDT testing
    • METIS-314988
    • functional testing

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