Use of wavelets to compare simulated yield patterns for precision agriculture at the field scale

A. (Jan) Verhagen; A. Stein; V. Epinat

doi:10.1023/A:1012347931122

Use of wavelets to compare simulated yield patterns for precision agriculture at the field scale

A. (Jan) Verhagen, A. Stein, V. Epinat

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	333-346
Journal	Precision agriculture
Volume	2
Issue number	4
DOIs	https://doi.org/10.1023/A:1012347931122
Publication status	Published - 2000

Keywords

EOS
ADLIB-ART-2093
ITC-ISI-JOURNAL-ARTICLE

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1023/A:1012347931122

Cite this

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title = "Use of wavelets to compare simulated yield patterns for precision agriculture at the field scale",

keywords = "EOS, ADLIB-ART-2093, ITC-ISI-JOURNAL-ARTICLE",

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pages = "333--346",

journal = "Precision agriculture",

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AU - Verhagen, A. (Jan)

AU - Stein, A.

AU - Epinat, V.

PY - 2000

Y1 - 2000

KW - EOS

KW - ADLIB-ART-2093

KW - ITC-ISI-JOURNAL-ARTICLE

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U2 - 10.1023/A:1012347931122

DO - 10.1023/A:1012347931122

M3 - Article

SN - 1385-2256

VL - 2

SP - 333

EP - 346

JO - Precision agriculture

JF - Precision agriculture

IS - 4

ER -

Use of wavelets to compare simulated yield patterns for precision agriculture at the field scale

Keywords

UN SDGs

Access to Document

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Cite this