Use of wavelets to compare simulated yield patterns for precision agriculture at the field scale

J. Verhagen, A. Stein, V. Epinat

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)333-346
JournalPrecision agriculture
Volume2
Issue number4
DOIs
Publication statusPublished - 2000

Keywords

  • EOS
  • ADLIB-ART-2093
  • ITC-ISI-JOURNAL-ARTICLE

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