Using a Universal Shadow-Test Assembler with Multistage Testing

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

Original languageEnglish
Title of host publicationComputerized Multistage Testing
Subtitle of host publicationTheory and Applications
EditorsDuanli Yan, Alina A. von Davier, Charles Lewis
PublisherChapman and Hall/CRC Press
Number of pages18
ISBN (Electronic)9780429096358
ISBN (Print)9781466505773
Publication statusPublished - 2014

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