Using a Universal Shadow-Test Assembler with Multistage Testing

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

Original language	English
Title of host publication	Computerized Multistage Testing
Subtitle of host publication	Theory and Applications
Editors	Duanli Yan, Alina A. von Davier, Charles Lewis
Publisher	Chapman and Hall/CRC Press
Chapter	7
Number of pages	18
ISBN (Electronic)	9780429096358
ISBN (Print)	9781466505773
DOIs	https://doi.org/10.1201/b16858-17
Publication status	Published - 2014

Access to Document

@inbook{398cf97cba9545e590486fb07d6a1e59,

title = "Using a Universal Shadow-Test Assembler with Multistage Testing",

author = "{van der Linden}, {Wim J.} and Qi Diao",

year = "2014",

doi = "10.1201/b16858-17",

language = "English",

isbn = "9781466505773",

editor = "Duanli Yan and {von Davier}, {Alina A.} and Charles Lewis",

booktitle = "Computerized Multistage Testing",

publisher = "Chapman and Hall/CRC Press",

}