Using the amplitude variation of a reverberation chamber channel to predict the synchronization of a wireless digital communication test system

Ray R. Tanuhardja; Luis A. Gonzalez; Chih-Ming Wang; William F. Young; Kate A. Remley; John M. Ladbury

doi:10.1109/ISEMC.2015.7256153

Using the amplitude variation of a reverberation chamber channel to predict the synchronization of a wireless digital communication test system

Ray R. Tanuhardja, Luis A. Gonzalez, Chih-Ming Wang, William F. Young, Kate A. Remley, John M. Ladbury

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

Abstract

We discuss the use of a metric based on the amplitude variation of a channel in the signal bandwidth to predict whether or not a digital wireless communication test system receiver will be able to demodulate a test signal. This metric is compared to another method consisting of the correlation calculated across the channel. A logistic regression analysis is used to provide a normalized assessment of the effectiveness of each metric as a predictive tool. We show that both metrics provide similar predictive capabilities, with the peak-to-minimum being significantly easier to calculate.

Original language	Undefined
Title of host publication	Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe
Place of Publication	USA
Publisher	IEEE
Pages	171-176
Number of pages	6
ISBN (Print)	978-1-4799-6615-8
DOIs	https://doi.org/10.1109/ISEMC.2015.7256153
Publication status	Published - 20 Aug 2015
Event	Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe 2015 - Dresden, Germany Duration: 16 Aug 2015 → 22 Aug 2015 http://conference.vde.com/emc2015/Pages/default.aspx

Publication series

Name
Publisher	IEEE Electromagnetic Compatibility Society

Conference

Conference	Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe 2015
Abbreviated title	EMC Europe
Country/Territory	Germany
City	Dresden
Period	16/08/15 → 22/08/15
Internet address	http://conference.vde.com/emc2015/Pages/default.aspx

Keywords

EWI-26188
METIS-314933
IR-98245

Access to Document

10.1109/ISEMC.2015.7256153

http://eprints.eemcs.utwente.nl/secure2/26188/01/032_5576_Ray_Dresden.pdf

Cite this

Tanuhardja, R. R., Gonzalez, L. A., Wang, C-M., Young, W. F., Remley, K. A., & Ladbury, J. M. (2015). Using the amplitude variation of a reverberation chamber channel to predict the synchronization of a wireless digital communication test system. In Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe (pp. 171-176). IEEE. https://doi.org/10.1109/ISEMC.2015.7256153

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abstract = "We discuss the use of a metric based on the amplitude variation of a channel in the signal bandwidth to predict whether or not a digital wireless communication test system receiver will be able to demodulate a test signal. This metric is compared to another method consisting of the correlation calculated across the channel. A logistic regression analysis is used to provide a normalized assessment of the effectiveness of each metric as a predictive tool. We show that both metrics provide similar predictive capabilities, with the peak-to-minimum being significantly easier to calculate.",

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Tanuhardja, RR, Gonzalez, LA, Wang, C-M, Young, WF, Remley, KA & Ladbury, JM 2015, Using the amplitude variation of a reverberation chamber channel to predict the synchronization of a wireless digital communication test system. in Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe. IEEE, USA, pp. 171-176, Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe 2015, Dresden, Germany, 16/08/15. https://doi.org/10.1109/ISEMC.2015.7256153

Using the amplitude variation of a reverberation chamber channel to predict the synchronization of a wireless digital communication test system. / Tanuhardja, Ray R.; Gonzalez, Luis A.; Wang, Chih-Ming et al.

Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe. USA : IEEE, 2015. p. 171-176.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Ladbury, John M.

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