Using the Oscillation Test Method to test for Delay Faults in Embedded Cores

H.J. Vermaak; H.G. Kerkhoff

doi:10.1109/AFRICON.2004.1406859

Using the Oscillation Test Method to test for Delay Faults in Embedded Cores

H.J. Vermaak
, H.G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

166 Downloads (Pure)

Abstract

Continual advances In the manufacturing processes of integrated circuits provide designers the ability to create more complex and denser architectures and increased functionality on a single chip. The increased usage of embedded cores necessitates a core-based test strategy in which cores are also tested separately. The IEEE P1500 proposed standard for embedded core test (SECT) is a standard under development which aim is to improve the testing of core-based system chips. This paper deals with the enhancement of the test wrapper and wrapper cells to provide a structure to be able to test embedded cores for delay faults. This approach allows delay fault testing of cores by using the digital oscillation test method and the help of the enhanced elements while staying compliant to the PI500 standard.

Original language	English
Title of host publication	IEEE AFRICON International Conferences on Electrical, Electronic and IT research activities
Place of Publication	Gabarone, Botswana
Publisher	IEEE
Pages	1105-1110
Number of pages	6
Volume	2
ISBN (Print)	0-7803-8605-16
DOIs	https://doi.org/10.1109/AFRICON.2004.1406859
Publication status	Published - 15 Sept 2004
Event	7th IEEE AFRICON International Conferences on Electrical, Electronic and IT Research Activities 2004 - Gabarone, Botswana Duration: 15 Sept 2004 → 17 Sept 2004

Conference

Conference	7th IEEE AFRICON International Conferences on Electrical, Electronic and IT Research Activities 2004
Country/Territory	Botswana
City	Gabarone
Period	15/09/04 → 17/09/04

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

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10.1109/AFRICON.2004.1406859

Cite this

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title = "Using the Oscillation Test Method to test for Delay Faults in Embedded Cores",

abstract = "Continual advances In the manufacturing processes of integrated circuits provide designers the ability to create more complex and denser architectures and increased functionality on a single chip. The increased usage of embedded cores necessitates a core-based test strategy in which cores are also tested separately. The IEEE P1500 proposed standard for embedded core test (SECT) is a standard under development which aim is to improve the testing of core-based system chips. This paper deals with the enhancement of the test wrapper and wrapper cells to provide a structure to be able to test embedded cores for delay faults. This approach allows delay fault testing of cores by using the digital oscillation test method and the help of the enhanced elements while staying compliant to the PI500 standard.",

author = "H.J. Vermaak and H.G. Kerkhoff",

year = "2004",

month = sep,

day = "15",

doi = "10.1109/AFRICON.2004.1406859",

language = "English",

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pages = "1105--1110",

booktitle = "IEEE AFRICON International Conferences on Electrical, Electronic and IT research activities",

publisher = "IEEE",

address = "United States",

note = "7th IEEE AFRICON International Conferences on Electrical, Electronic and IT Research Activities 2004 ; Conference date: 15-09-2004 Through 17-09-2004",

}

Vermaak, HJ & Kerkhoff, HG 2004, Using the Oscillation Test Method to test for Delay Faults in Embedded Cores. in IEEE AFRICON International Conferences on Electrical, Electronic and IT research activities. vol. 2, IEEE, Gabarone, Botswana, pp. 1105-1110, 7th IEEE AFRICON International Conferences on Electrical, Electronic and IT Research Activities 2004, Gabarone, Botswana, 15/09/04. https://doi.org/10.1109/AFRICON.2004.1406859

Using the Oscillation Test Method to test for Delay Faults in Embedded Cores. / Vermaak, H.J.; Kerkhoff, H.G.
IEEE AFRICON International Conferences on Electrical, Electronic and IT research activities. Vol. 2 Gabarone, Botswana: IEEE, 2004. p. 1105-1110.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Using the Oscillation Test Method to test for Delay Faults in Embedded Cores

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PY - 2004/9/15

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N2 - Continual advances In the manufacturing processes of integrated circuits provide designers the ability to create more complex and denser architectures and increased functionality on a single chip. The increased usage of embedded cores necessitates a core-based test strategy in which cores are also tested separately. The IEEE P1500 proposed standard for embedded core test (SECT) is a standard under development which aim is to improve the testing of core-based system chips. This paper deals with the enhancement of the test wrapper and wrapper cells to provide a structure to be able to test embedded cores for delay faults. This approach allows delay fault testing of cores by using the digital oscillation test method and the help of the enhanced elements while staying compliant to the PI500 standard.

AB - Continual advances In the manufacturing processes of integrated circuits provide designers the ability to create more complex and denser architectures and increased functionality on a single chip. The increased usage of embedded cores necessitates a core-based test strategy in which cores are also tested separately. The IEEE P1500 proposed standard for embedded core test (SECT) is a standard under development which aim is to improve the testing of core-based system chips. This paper deals with the enhancement of the test wrapper and wrapper cells to provide a structure to be able to test embedded cores for delay faults. This approach allows delay fault testing of cores by using the digital oscillation test method and the help of the enhanced elements while staying compliant to the PI500 standard.

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DO - 10.1109/AFRICON.2004.1406859

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BT - IEEE AFRICON International Conferences on Electrical, Electronic and IT research activities

PB - IEEE

CY - Gabarone, Botswana

T2 - 7th IEEE AFRICON International Conferences on Electrical, Electronic and IT Research Activities 2004

Y2 - 15 September 2004 through 17 September 2004

ER -

Using the Oscillation Test Method to test for Delay Faults in Embedded Cores

Abstract

Conference

UN SDGs

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