Vacuum chamber for sample attachment in atomic force microscopy

Constant A.J. Putman, Kees O. van der Werf, Geeske van Oort, Bart G. de Grooth, Niek F. van Hulst, Jan Greve

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Abstract

A small ring-shaped vacuum chamber has been constructed and connected to the piezotube used for scanning samples in the atomic force microscope (AFM). Samples made up of any material, up to 50 mm in diameter, can be firmly attached o­nto the piezotube without causing damage to the sample. A 50-l beer container forms a buffer between vacuum pump and chamber. With this supply of vacuum, the AFM can be operated for a 4-8 h period without turning o­n the vacuum pump again. Samples can be changed within 30 s. The scan frequency when using microscope slides is limited to 40 Hz due to resonance effects of the microscope slides.
Original languageEnglish
Pages (from-to)4012-4013
Number of pages2
JournalReview of scientific instruments
Volume63
Issue number8
DOIs
Publication statusPublished - 1992

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Putman, C. A. J., van der Werf, K. O., van Oort, G., de Grooth, B. G., van Hulst, N. F., & Greve, J. (1992). Vacuum chamber for sample attachment in atomic force microscopy. Review of scientific instruments, 63(8), 4012-4013. https://doi.org/10.1063/1.1143258