Vacuum chamber for sample attachment in atomic force microscopy

Constant A.J. Putman; Kees O. van der Werf; Geeske van Oort; Bart G. de Grooth; Niek F. van Hulst; Jan Greve

doi:10.1063/1.1143258

Vacuum chamber for sample attachment in atomic force microscopy

Constant A.J. Putman, Kees O. van der Werf, Geeske van Oort, Bart G. de Grooth, Niek F. van Hulst, Jan Greve

Optical Sciences

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Abstract

A small ring-shaped vacuum chamber has been constructed and connected to the piezotube used for scanning samples in the atomic force microscope (AFM). Samples made up of any material, up to 50 mm in diameter, can be firmly attached onto the piezotube without causing damage to the sample. A 50-l beer container forms a buffer between vacuum pump and chamber. With this supply of vacuum, the AFM can be operated for a 4-8 h period without turning on the vacuum pump again. Samples can be changed within 30 s. The scan frequency when using microscope slides is limited to 40 Hz due to resonance effects of the microscope slides.

Original language	English
Pages (from-to)	4012-4013
Number of pages	2
Journal	Review of scientific instruments
Volume	63
Issue number	8
DOIs	https://doi.org/10.1063/1.1143258
Publication status	Published - 1992

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Putman1992vacuumFinal published version, 255 KB

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@article{95721ac72fc44bafa79c670bbaab29b0,

title = "Vacuum chamber for sample attachment in atomic force microscopy",

abstract = "A small ring-shaped vacuum chamber has been constructed and connected to the piezotube used for scanning samples in the atomic force microscope (AFM). Samples made up of any material, up to 50 mm in diameter, can be firmly attached onto the piezotube without causing damage to the sample. A 50-l beer container forms a buffer between vacuum pump and chamber. With this supply of vacuum, the AFM can be operated for a 4-8 h period without turning on the vacuum pump again. Samples can be changed within 30 s. The scan frequency when using microscope slides is limited to 40 Hz due to resonance effects of the microscope slides.",

author = "Putman, {Constant A.J.} and {van der Werf}, {Kees O.} and {van Oort}, Geeske and {de Grooth}, {Bart G.} and {van Hulst}, {Niek F.} and Jan Greve",

year = "1992",

doi = "10.1063/1.1143258",

language = "English",

volume = "63",

pages = "4012--4013",

journal = "Review of scientific instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "8",

}

TY - JOUR

T1 - Vacuum chamber for sample attachment in atomic force microscopy

AU - Putman, Constant A.J.

AU - van der Werf, Kees O.

AU - van Oort, Geeske

AU - de Grooth, Bart G.

AU - van Hulst, Niek F.

AU - Greve, Jan

PY - 1992

Y1 - 1992

N2 - A small ring-shaped vacuum chamber has been constructed and connected to the piezotube used for scanning samples in the atomic force microscope (AFM). Samples made up of any material, up to 50 mm in diameter, can be firmly attached onto the piezotube without causing damage to the sample. A 50-l beer container forms a buffer between vacuum pump and chamber. With this supply of vacuum, the AFM can be operated for a 4-8 h period without turning on the vacuum pump again. Samples can be changed within 30 s. The scan frequency when using microscope slides is limited to 40 Hz due to resonance effects of the microscope slides.

AB - A small ring-shaped vacuum chamber has been constructed and connected to the piezotube used for scanning samples in the atomic force microscope (AFM). Samples made up of any material, up to 50 mm in diameter, can be firmly attached onto the piezotube without causing damage to the sample. A 50-l beer container forms a buffer between vacuum pump and chamber. With this supply of vacuum, the AFM can be operated for a 4-8 h period without turning on the vacuum pump again. Samples can be changed within 30 s. The scan frequency when using microscope slides is limited to 40 Hz due to resonance effects of the microscope slides.

U2 - 10.1063/1.1143258

DO - 10.1063/1.1143258

M3 - Article

SN - 0034-6748

VL - 63

SP - 4012

EP - 4013

JO - Review of scientific instruments

JF - Review of scientific instruments

IS - 8

ER -

Vacuum chamber for sample attachment in atomic force microscopy

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