Abstract
This paper presents a process qualification and characterization strategy that can extend the foundry process reliability potential to meet specific automotive mission profile requirements. In this case study, data and analyses are provided that lead to sufficient confidence for pushing the allowed mission profile envelope of a process towards more aggressive (automotive) applications.
Original language | English |
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Title of host publication | 2010 IEEE International Reliability Physics Symposium, IRPS 2010 |
Subtitle of host publication | Anaheim, California, USA, 2 - 6 May 2010 |
Place of Publication | Piscataway, NJ |
Publisher | IEEE Computer Society |
Pages | 111-116 |
Number of pages | 6 |
ISBN (Print) | 978-1-4244-5430-3, 978-1-4244-5431-0 |
DOIs | |
Publication status | Published - 2 May 2010 |
Event | 48th Annual IEEE International Reliability Physics Symposium, IRPS 2010 - Hyatt Regency Orange County Garden Grove, Anaheim, United States Duration: 2 May 2010 → 6 May 2010 Conference number: 48 |
Conference
Conference | 48th Annual IEEE International Reliability Physics Symposium, IRPS 2010 |
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Abbreviated title | IRPS |
Country/Territory | United States |
City | Anaheim |
Period | 2/05/10 → 6/05/10 |
Keywords
- METIS-270932
- IR-72455
- SRAM Vddmin
- HTOL
- qualification strategy
- guard band
- test screens
- EWI-18190
- ppm level