Validity of the Effective Mass Approximation in Silicon and Germanium Inversion Layers

J.P.J. van der Steen, D. Esseni, P. Palestri, L. Selmi

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 11th International Workshop on Computational Electronics (IWCE 2006)
    Place of PublicationVienna, Austria
    PublisherICWE
    Pages301-302
    Number of pages2
    ISBN (Print)3-901578-16-1
    Publication statusPublished - 28 May 2006
    Event11th International Workshop on Computational Electronics, IWCE 2006 - Vienna, Austria
    Duration: 25 May 200627 May 2006

    Workshop

    Workshop11th International Workshop on Computational Electronics, IWCE 2006
    Abbreviated titleIWCE
    CountryAustria
    CityVienna
    Period25/05/0627/05/06

    Keywords

    • METIS-238047
    • SC-DPM: Device Physics and Modeling
    • EWI-3678
    • IR-62899

    Cite this

    van der Steen, J. P. J., Esseni, D., Palestri, P., & Selmi, L. (2006). Validity of the Effective Mass Approximation in Silicon and Germanium Inversion Layers. In Proceedings of the 11th International Workshop on Computational Electronics (IWCE 2006) (pp. 301-302). Vienna, Austria: ICWE.