Validity of the Effective Mass Approximation in Silicon and Germanium Inversion Layers

J.P.J. van der Steen; D. Esseni; P. Palestri; L. Selmi

Validity of the Effective Mass Approximation in Silicon and Germanium Inversion Layers

J.P.J. van der Steen, D. Esseni, P. Palestri, L. Selmi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the 11th International Workshop on Computational Electronics (IWCE 2006)
Place of Publication	Vienna, Austria
Publisher	ICWE
Pages	301-302
Number of pages	2
ISBN (Print)	3-901578-16-1
Publication status	Published - 28 May 2006
Event	11th International Workshop on Computational Electronics, IWCE 2006 - Vienna, Austria Duration: 25 May 2006 → 27 May 2006

Workshop

Workshop	11th International Workshop on Computational Electronics, IWCE 2006
Abbreviated title	IWCE
Country/Territory	Austria
City	Vienna
Period	25/05/06 → 27/05/06

Keywords

METIS-238047
SC-DPM: Device Physics and Modeling
EWI-3678
IR-62899

Cite this

@inproceedings{9d5476ca8be34ebeb60072a6baca4a06,

title = "Validity of the Effective Mass Approximation in Silicon and Germanium Inversion Layers",

keywords = "METIS-238047, SC-DPM: Device Physics and Modeling, EWI-3678, IR-62899",

author = "\{van der Steen\}, J.P.J. and D. Esseni and P. Palestri and L. Selmi",

year = "2006",

month = may,

day = "28",

language = "English",

isbn = "3-901578-16-1",

pages = "301--302",

booktitle = "Proceedings of the 11th International Workshop on Computational Electronics (IWCE 2006)",

publisher = "ICWE",

note = "11th International Workshop on Computational Electronics, IWCE 2006, IWCE ; Conference date: 25-05-2006 Through 27-05-2006",

}

van der Steen, JPJ, Esseni, D, Palestri, P & Selmi, L 2006, Validity of the Effective Mass Approximation in Silicon and Germanium Inversion Layers. in Proceedings of the 11th International Workshop on Computational Electronics (IWCE 2006). ICWE, Vienna, Austria, pp. 301-302, 11th International Workshop on Computational Electronics, IWCE 2006, Vienna, Austria, 25/05/06.

Validity of the Effective Mass Approximation in Silicon and Germanium Inversion Layers. / van der Steen, J.P.J.; Esseni, D.; Palestri, P. et al.
Proceedings of the 11th International Workshop on Computational Electronics (IWCE 2006). Vienna, Austria: ICWE, 2006. p. 301-302.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Validity of the Effective Mass Approximation in Silicon and Germanium Inversion Layers

AU - van der Steen, J.P.J.

AU - Esseni, D.

AU - Palestri, P.

AU - Selmi, L.

PY - 2006/5/28

Y1 - 2006/5/28

KW - METIS-238047

KW - SC-DPM: Device Physics and Modeling

KW - EWI-3678

KW - IR-62899

M3 - Conference contribution

SN - 3-901578-16-1

SP - 301

EP - 302

BT - Proceedings of the 11th International Workshop on Computational Electronics (IWCE 2006)

PB - ICWE

CY - Vienna, Austria

T2 - 11th International Workshop on Computational Electronics, IWCE 2006

Y2 - 25 May 2006 through 27 May 2006

ER -