Verification of redox-processes as switching and retention failure mechanisms in Nb:SrTiO3/metal devices

C. Baeumer*, N. Raab, T. Menke, C. Schmitz, R. Rosezin, P. Müller, M. Andrä, V. Feyer, R. Bruchhaus, F. Gunkel, C. M. Schneider, Rainer Waser, R. Dittmann

*Corresponding author for this work

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