Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS

N.A. Belsey, D.J.H. Cant, C. Minelli, J.R. Araujo, B. Bock, P. Brüner, D.G. Castner, C. Ceccone, J.D.P. Counsell, P.M. Dietrich, M.H. Engelhard, S. Fearn, C.E. Galhardo, H. Kalbe, J.W. Kim, L. Lartundo-Rojas, H.S. Luftman, T.S. Nunney, J. Pseiner, E.F. SmithV. Spampinato, J.M. Sturm, A.G. Thomas, J.P.W. Treacy, L. Veith, M. Wagstaffe, H. Wang, M. Wang, Y.C. Wang, W. Werner, L. Yang, A.G. Shard

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