Very Fast Transient ESD measurements

J.R.M. Luchies, K. de Kort, J.J. Vrehen, J.F. Verweij

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationUniversiteit Twente, Enschede
    Publication statusPublished - 17 Jun 1993

    Keywords

    • METIS-117273

    Cite this

    Luchies, J. R. M., de Kort, K., Vrehen, J. J., & Verweij, J. F. (1993, Jun 17). Very Fast Transient ESD measurements. Universiteit Twente, Enschede.