Visualisation Techniques for Random Telegraph Signals in MOSFETs

A.P. van der Wel, Eric A.M. Klumperink, J.S. Kolhatkar, E. Hoekstra, Bram Nauta

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

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    Abstract

    In the study of LF noise in MOSFETS, it has become clear that Random Telegraph Signals (RTS) are dominant. When a MOSFET is subjected to large-signal excitation, the RTS noise is influenced. In this paper, we present different visualizations of the transient behaviour of the RTS.
    Original languageEnglish
    Title of host publicationProceedings SAFE & ProRISC 2004
    Place of PublicationUtrecht
    PublisherSTW
    Number of pages6
    ISBN (Print)90-73461-43-X
    Publication statusPublished - Nov 2004
    Event15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 - Veldhoven, Netherlands
    Duration: 25 Nov 200426 Nov 2004
    Conference number: 15

    Conference

    Conference15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004
    Abbreviated titleProRisc
    CountryNetherlands
    CityVeldhoven
    Period25/11/0426/11/04

    Keywords

    • LF noise
    • Large signal excitation
    • MOSFET
    • Random telegraph signals

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