VLSI Reliability in Europe

J.F. Verweij, Jan F. Verweij

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    Abstract

    Several issue's regarding VLSI reliability research in Europe are discussed. Organizations involved in stimulating the activities on reliability by exchanging information or supporting research programs are described. Within one such program, ESPRIT, a technical interest group on IC reliability was formed to formulate particular needs and necessary improvements in education and research. In addition to ESPRIT research projects, there are smaller projects on reliability subjects. Two examples, one dealing with plastic-encapsulation and the other with electrostatic discharge, are treated in some detail. Some achievements in the areas of oxide breakdown and plastic encapsulated ICs in temperature cycling are also presented. A few opinions are offered on trends in reliability engineering, including reliability circuit simulation
    Original languageUndefined
    Pages (from-to)675-681
    JournalProceedings of the IEEE
    Volume81
    Issue number5
    DOIs
    Publication statusPublished - 1993

    Keywords

    • METIS-112036
    • IR-15162

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