Wafer-scale fabrication of scanning thermal probes with integrated metal nanowire resistive elements for sensing and heating

Kodai Hatakeyama, Edin Sarajlic, Martin Herman Siekman, L. Jalabert, H. Fujita, Niels Roelof Tas, Leon Abelmann

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

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