Welcome letter

Anthony Walton, Jurriaan Schmitz, Stewart Smith

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publication2008 IEEE International Conference on Microelectronic Test Structures
    Subtitle of host publicationComference Proceedings March 24-27 The University of Edinburgh, UK
    PublisherIEEE
    Pagesiii
    Number of pages1
    ISBN (Print)978-1-4244-1800-8
    DOIs
    Publication statusPublished - 15 Sep 2008
    Event21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008 - University of Edinburgh, Edinburgh, United Kingdom
    Duration: 24 Mar 200827 Mar 2008
    Conference number: 21
    http://www.homepages.ed.ac.uk/ajw/ICMTS/prog08.pdf

    Publication series

    NameIEEE International Conference on Microelectronic Test Structures

    Conference

    Conference21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008
    Abbreviated titleICMTS
    CountryUnited Kingdom
    CityEdinburgh
    Period24/03/0827/03/08
    Internet address

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