Welcome letter

Anthony Walton; Jurriaan Schmitz; Stewart Smith

doi:10.1109/ICMTS.2008.4509304

Welcome letter

Anthony Walton
, Jurriaan Schmitz
, Stewart Smith

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Original language	English
Title of host publication	2008 IEEE International Conference on Microelectronic Test Structures
Subtitle of host publication	Comference Proceedings March 24-27 The University of Edinburgh, UK
Publisher	IEEE
Pages	iii
Number of pages	1
ISBN (Print)	978-1-4244-1800-8
DOIs	https://doi.org/10.1109/ICMTS.2008.4509304
Publication status	Published - 15 Sept 2008
Event	21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008 - University of Edinburgh, Edinburgh, United Kingdom Duration: 24 Mar 2008 → 27 Mar 2008 Conference number: 21 http://www.homepages.ed.ac.uk/ajw/ICMTS/prog08.pdf

Publication series

Name	IEEE International Conference on Microelectronic Test Structures

Conference

Conference	21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008
Abbreviated title	ICMTS
Country/Territory	United Kingdom
City	Edinburgh
Period	24/03/08 → 27/03/08
Internet address	http://www.homepages.ed.ac.uk/ajw/ICMTS/prog08.pdf

Access to Document

10.1109/ICMTS.2008.4509304

Cite this

@inproceedings{66cd0b306e874ddbadadc8c56fd3f908,

title = "Welcome letter",

author = "Anthony Walton and Jurriaan Schmitz and Stewart Smith",

year = "2008",

month = sep,

day = "15",

doi = "10.1109/ICMTS.2008.4509304",

language = "English",

isbn = "978-1-4244-1800-8",

series = "IEEE International Conference on Microelectronic Test Structures",

publisher = "IEEE",

pages = "iii",

booktitle = "2008 IEEE International Conference on Microelectronic Test Structures",

address = "United States",

note = "21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008, ICMTS ; Conference date: 24-03-2008 Through 27-03-2008",

url = "http://www.homepages.ed.ac.uk/ajw/ICMTS/prog08.pdf",

}

Walton, A, Schmitz, J & Smith, S 2008, Welcome letter. in 2008 IEEE International Conference on Microelectronic Test Structures: Comference Proceedings March 24-27 The University of Edinburgh, UK. IEEE International Conference on Microelectronic Test Structures, IEEE, pp. iii, 21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008, Edinburgh, United Kingdom, 24/03/08. https://doi.org/10.1109/ICMTS.2008.4509304

Welcome letter. / Walton, Anthony; Schmitz, Jurriaan; Smith, Stewart.
2008 IEEE International Conference on Microelectronic Test Structures: Comference Proceedings March 24-27 The University of Edinburgh, UK. IEEE, 2008. p. iii (IEEE International Conference on Microelectronic Test Structures).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Welcome letter

AU - Walton, Anthony

AU - Schmitz, Jurriaan

AU - Smith, Stewart

N1 - Conference code: 21

PY - 2008/9/15

Y1 - 2008/9/15

UR - https://www.scopus.com/pages/publications/51349148540

U2 - 10.1109/ICMTS.2008.4509304

DO - 10.1109/ICMTS.2008.4509304

M3 - Conference contribution

AN - SCOPUS:51349148540

SN - 978-1-4244-1800-8

T3 - IEEE International Conference on Microelectronic Test Structures

SP - iii

BT - 2008 IEEE International Conference on Microelectronic Test Structures

PB - IEEE

T2 - 21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008

Y2 - 24 March 2008 through 27 March 2008

ER -

Welcome letter

Publication series

Conference

Access to Document

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Cite this