Why Frequency Domain Tests Like IEC 61000-4-19 Are Not Valid: a Call for Time Domain Testing

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    Abstract

    Testing of electrical and electronic equipment is generally performed using frequency domain tests like the IEC 61000-4-19. This standard covers the immunity to conducted, differential mode disturbances and signaling in the frequency range from 2 kHz to 150 kHz. Previous research describes several electromagnetic interference (EMI) cases in this frequency range, which cover pulsed, fast changing, current waveforms. For example cases are described where static energy meters can give misreadings when loaded with pulsed currents. Fast changing time domain signals are not covered by the standards. In this paper it is shown that the current frequency domain tests are not sufficient to determine the equipment's immunity, because of for instance non-linear effects, including saturation, digital sampling error effects and other non linear time invariant (LTI) effects.
    Original languageEnglish
    Title of host publication2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE
    Place of PublicationUSA
    PublisherIEEE
    Pages124-128
    Number of pages5
    ISBN (Electronic)978-1-7281-0594-9
    ISBN (Print)978-1-7281-0595-6
    DOIs
    Publication statusE-pub ahead of print/First online - 17 Oct 2019
    EventEuropean Conference on Electromagnetic Compatibility - EMC Europe 2019 - Barcelona Campus Nord, Barcelona, Spain
    Duration: 2 Sep 20196 Sep 2019

    Conference

    ConferenceEuropean Conference on Electromagnetic Compatibility - EMC Europe 2019
    Abbreviated titleEMC Europe 2019
    CountrySpain
    CityBarcelona
    Period2/09/196/09/19

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    Testing
    Signal interference
    Electronic equipment
    Sampling

    Cite this

    ten Have, Bas ; Hartman, Tom ; Moonen, Niek ; Leferink, Frank. / Why Frequency Domain Tests Like IEC 61000-4-19 Are Not Valid : a Call for Time Domain Testing. 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE. USA : IEEE, 2019. pp. 124-128
    @inproceedings{af69060407254181bcf2e51e8e9e9ba4,
    title = "Why Frequency Domain Tests Like IEC 61000-4-19 Are Not Valid: a Call for Time Domain Testing",
    abstract = "Testing of electrical and electronic equipment is generally performed using frequency domain tests like the IEC 61000-4-19. This standard covers the immunity to conducted, differential mode disturbances and signaling in the frequency range from 2 kHz to 150 kHz. Previous research describes several electromagnetic interference (EMI) cases in this frequency range, which cover pulsed, fast changing, current waveforms. For example cases are described where static energy meters can give misreadings when loaded with pulsed currents. Fast changing time domain signals are not covered by the standards. In this paper it is shown that the current frequency domain tests are not sufficient to determine the equipment's immunity, because of for instance non-linear effects, including saturation, digital sampling error effects and other non linear time invariant (LTI) effects.",
    author = "{ten Have}, Bas and Tom Hartman and Niek Moonen and Frank Leferink",
    year = "2019",
    month = "10",
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    doi = "10.1109/EMCEurope.2019.8872070",
    language = "English",
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    ten Have, B, Hartman, T, Moonen, N & Leferink, F 2019, Why Frequency Domain Tests Like IEC 61000-4-19 Are Not Valid: a Call for Time Domain Testing. in 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE., 8872070, IEEE, USA, pp. 124-128, European Conference on Electromagnetic Compatibility - EMC Europe 2019, Barcelona, Spain, 2/09/19. https://doi.org/10.1109/EMCEurope.2019.8872070

    Why Frequency Domain Tests Like IEC 61000-4-19 Are Not Valid : a Call for Time Domain Testing. / ten Have, Bas ; Hartman, Tom; Moonen, Niek; Leferink, Frank.

    2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE. USA : IEEE, 2019. p. 124-128 8872070.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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