X-ray examination apparatus with an imaging arrangement having a plurality of image sensors

Cornelis H. Slump (Inventor)

    Research output: Patent

    18 Downloads (Pure)


    An imaging arrangement including a multi-sensor for use in an x-ray examination apparatus is described that combines a plurality of partially overlapping sub-images, resulting in an increased effective sensor area when compared to a single sensor-image. Thus an imaging arrangement is provided suitable for imaging a large area output screen of an image intensifier by way of semiconductor image sensors. Image artifacts owing to variations in the alignment of the respective image sensors are corrected for by applying geometric transformation to respective electronic sub-image generated by the image sensors. The transformed electronic sub-images are assembled into a recombined image. Further image quality improvement is obtained by performing evening operations in overlapping regions of the transformed sub-images.
    Original languageUndefined
    Patent numberUS19950573917
    Publication statusSubmitted - 18 Dec 1995


    • X-ray
    • Detector
    • EWI-20686
    • equipment

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