X-ray scattering and the chemical bond in N2 and CN

P.P.M. Groenewegen, J. Zeevalkink, D. Feil

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Abstract

X-ray scattering from the chemical bond within N2 and CN- has been studied in detail. Differences in scattering from these systems, derived from bonding and non-bonding models, are characterized by R values of ~ 0.04. Partitioning of the scattering into core and valence electron parts clearly demonstrates that the bonding effects are completely situated in the valence electron structure of the systems. Therefore, new evidence has been contributed to support valence structure analysis methods presently employed in X-ray diffraction structure studies.
Original languageUndefined
Pages (from-to)487-491
JournalActa crystallographica Section A: Crystal physics, diffraction, theoretical and general crystallography
Volume27
DOIs
Publication statusPublished - 1971

Keywords

  • IR-59126

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