X-ray scattering and the chemical bond in N2 and CN

P.P.M. Groenewegen, J. Zeevalkink, D. Feil

Research output: Contribution to journalArticleAcademic

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Abstract

X-ray scattering from the chemical bond within N2 and CN- has been studied in detail. Differences in scattering from these systems, derived from bonding and non-bonding models, are characterized by R values of ~ 0.04. Partitioning of the scattering into core and valence electron parts clearly demonstrates that the bonding effects are completely situated in the valence electron structure of the systems. Therefore, new evidence has been contributed to support valence structure analysis methods presently employed in X-ray diffraction structure studies.
Original languageUndefined
Pages (from-to)487-491
JournalActa crystallographica Section A: Crystal physics, diffraction, theoretical and general crystallography
Volume27
DOIs
Publication statusPublished - 1971

Keywords

  • IR-59126

Cite this

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abstract = "X-ray scattering from the chemical bond within N2 and CN- has been studied in detail. Differences in scattering from these systems, derived from bonding and non-bonding models, are characterized by R values of ~ 0.04. Partitioning of the scattering into core and valence electron parts clearly demonstrates that the bonding effects are completely situated in the valence electron structure of the systems. Therefore, new evidence has been contributed to support valence structure analysis methods presently employed in X-ray diffraction structure studies.",
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author = "P.P.M. Groenewegen and J. Zeevalkink and D. Feil",
year = "1971",
doi = "10.1107/S0567739471001049",
language = "Undefined",
volume = "27",
pages = "487--491",
journal = "Acta crystallographica Section A: Foundations of crystallography",
issn = "0108-7673",
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X-ray scattering and the chemical bond in N2 and CN. / Groenewegen, P.P.M.; Zeevalkink, J.; Feil, D.

In: Acta crystallographica Section A: Crystal physics, diffraction, theoretical and general crystallography, Vol. 27, 1971, p. 487-491.

Research output: Contribution to journalArticleAcademic

TY - JOUR

T1 - X-ray scattering and the chemical bond in N2 and CN

AU - Groenewegen, P.P.M.

AU - Zeevalkink, J.

AU - Feil, D.

PY - 1971

Y1 - 1971

N2 - X-ray scattering from the chemical bond within N2 and CN- has been studied in detail. Differences in scattering from these systems, derived from bonding and non-bonding models, are characterized by R values of ~ 0.04. Partitioning of the scattering into core and valence electron parts clearly demonstrates that the bonding effects are completely situated in the valence electron structure of the systems. Therefore, new evidence has been contributed to support valence structure analysis methods presently employed in X-ray diffraction structure studies.

AB - X-ray scattering from the chemical bond within N2 and CN- has been studied in detail. Differences in scattering from these systems, derived from bonding and non-bonding models, are characterized by R values of ~ 0.04. Partitioning of the scattering into core and valence electron parts clearly demonstrates that the bonding effects are completely situated in the valence electron structure of the systems. Therefore, new evidence has been contributed to support valence structure analysis methods presently employed in X-ray diffraction structure studies.

KW - IR-59126

U2 - 10.1107/S0567739471001049

DO - 10.1107/S0567739471001049

M3 - Article

VL - 27

SP - 487

EP - 491

JO - Acta crystallographica Section A: Foundations of crystallography

JF - Acta crystallographica Section A: Foundations of crystallography

SN - 0108-7673

ER -