X-ray scattering and the chemical bond in N2 and CN

P.P.M. Groenewegen, J. Zeevalkink, D. Feil

Research output: Contribution to journalArticleAcademic

14 Citations (Scopus)
155 Downloads (Pure)

Abstract

X-ray scattering from the chemical bond within N2 and CN- has been studied in detail. Differences in scattering from these systems, derived from bonding and non-bonding models, are characterized by R values of ~ 0.04. Partitioning of the scattering into core and valence electron parts clearly demonstrates that the bonding effects are completely situated in the valence electron structure of the systems. Therefore, new evidence has been contributed to support valence structure analysis methods presently employed in X-ray diffraction structure studies.
Original languageEnglish
Pages (from-to)487-491
JournalActa crystallographica Section A: Crystal physics, diffraction, theoretical and general crystallography
Volume27
DOIs
Publication statusPublished - 1971

Fingerprint

Dive into the research topics of 'X-ray scattering and the chemical bond in N2 and CN'. Together they form a unique fingerprint.

Cite this